"To Measure Is To Know"

Joseph F. Keithley Award

Sponsored by Keithley Instruments, Incorporated

The IEEE Joseph F. Keithley Award in Instrumentation & Measurement award is presented for outstanding contributions in electrical measurements. It was established in 2001 and was presented for the first time in 2004. It is awarded by the IEEE.

To nominate, please go to:  http://www.ieee.org/about/awards/tfas/keithley.html

Award Recipients

Reza Zoughi Headshot Photo
2011
"For contributions to microwave and millimeter wave measurement techniques for nondestructive testing and evaluation."
Bryan Peter Kibble Headshot Photo
2009
"For pioneering experiments and techniques in the field of fundamental electrical metrology leading to the realization of SI units."
Robert Fulks Headshot Photo
2008
"For pioneering developments in automated measurements."
Douglas Rytting Headshot Photo
2007
"For seminal technical and leadership contributions to microwave network analyzer technology."
Alessandro Ferrero Headshot Photo
2006
"For seminal technical and leadership contributions to microwave network analyzer technology."
Clark Hamilton Headshot Photo
2005
"For making the dc Josephson array voltage standard a practical reality."
2004
"For fundamental contributions to electrical measurements, with particular emphasis on the development of impedance bridges and standards, and the application of microprocessors to impedance measurement science."

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