"To Measure Is To Know"

Technical Committee Chair

Andrzej
Barwicz
Universite du Quebec a Trois-Rivieres, Ecole d'Ingegnerie
+1-819-376-5071
Yeou Song Brian Lee Headshot Photo
Yeou Song
Lee
Metrology Manager, Department of Quality
408-201-1976
Vincenzo Piuri Headshot Photo
Vincenzo
Piuri
University of Milan
+39-02-5033-0066
+39-02-5033-0010
Mark Yeary Headshot Photo
Mark
Yeary
University of Oklahoma, School of Electrical & Computer Engineering, Atmospheric Radar Research Center
I&M AdCom (2013-2016); TIM Associate Editor (2013-2014); Technical Committee Chair

Mark Yeary (S’95–M’00–SM’03) received the B.S. (honors), M.S., and Ph.D. degrees from the Department of Electrical Engineering, Texas A&M University (TAMU), College Station, in 1992, 1994, and 1999, respectively. Following his graduation in 1999, he was a member of the DSP group and a Lecturer with the Department of Electrical Engineering, TAMU, where he continued to lead a variety of industrially sponsored projects. Since the fall of 2002, he has been a faculty member in the Department of Electrical and Computer Engineering, University of Oklahoma, Norman.

Ruqiang Yan Headshot Photo
Ruqiang
Yan
School of Instrument Science and Engineering, Southeast UniversityNo. 2 Sipailou
Chapter Chair; Technical Committee Chair; TIM Associate Editor (2013-2014)
+86 (135) 84054760
George Zentai Headshot Photo
George
Zentai
Ginzton Technology Center of Varian Medical Systems
+1 (650) 623-1247
Technical Committee Chair

Dr. George Zentai is a senior scientist and R&D manager at Varian Medical Systems in Palo Alto, CA with over 30 years of experience encompassing project and product management, research, design, development, testing and manufacturing for a variety of products. His experience includes digital X-ray detectors, amorphous semiconductors, photo-electronic elements for high speed data transmission, industrial and medical lasers and laser projection systems for entertainment.

Headshot Photo
Peter
Wide
Northern Research Institute
Technical Committee Chair
(+47) 76 96 53 56
(+47) 76 96 53 51

Prof. Peter Wide received his MSc. Eng. and Licentiate-of-Technology degrees in 1984 and 1987 from the Dept. of Measurement Technology, University of Linköping, Sweden. In parallel to his academic career he has worked in different electronic industries for more than 15 years as test engineer, development manager, and technical consultant. He received his PhD in Measurement Science and Technology from Linköping University in 1996.

Yicheng Wang Headshot Photo
Yicheng
Wang
National Institute of Standards and Technology (NIST)
Technical Committee Chair

Yicheng Wang (M'96-SM'03-F’09) was born in Zhejiang, China, on January 17, 1960. He graduated from Zhejiang University in China with a B.A. degree in Physics in 1982.  He received a Ph.D. degree in atomic physics from the College of William and Mary, Williamsburg, VA, in 1987.

Marc Vanden Bossche Headshot Photo
Marc
Vanden Bossche
NMDG
(32) 3 890 46 12
Technical Committee Chair
(32) 3 890 46 29

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