You are here
R. Zoughi received his B.S.E.E, M.S.E.E, and Ph.D. degrees in electrical engineering (radar remote sensing, radar systems, and microwaves) from the University of Kansas where from 1981 until 1987 he was at the Radar Systems and Remote Sensing Laboratory (RSL). Currently he is the Schlumberger Endowed Professor of Electrical and Computer Engineering at Missouri University of Science and Technology (Missouri S&T). Prior to joining Missouri S&T in January 2001 and since 1987 he was with the Electrical and Computer Engineering Department at Colorado State University (CSU), where he was a professor and established the Applied Microwave Nondestructive Testing Laboratory (amntl) (http://amntl.mst.edu/). Dr. Zoughi held the position of Business Challenge Endowed Professor of Electrical and Computer Engineering from 1995 to 1997 while at CSU.
While at CSU he received nine teaching awards, including the State Board of Agriculture, Excellence in Undergraduate Teaching Award and the Abell Faculty Teaching Award. Since at Missouri S&T he has received seventeen Outstanding Teaching Awards & Commendations. He is the recipient of the 2007 IEEE Instrumentation and Measurement Society Distinguished Service Award, the 2009 American Society for Nondestructive Testing (ASNT) Research Award for Sustained Excellence and the 2011 IEEE Joseph F. Keithley Award in Instrumentation and Measurement. In 2013 he and his co-authors received the H. A. Wheeler Applications Prize Paper Award from the IEEE Antennas and Propagation Society (APS).
He is the author of a textbook entitled “Microwave Nondestructive Testing and Evaluation Principles” KLUWER Academic Publishers, 2000, and the co-author of a chapter on Microwave Techniques in the book entitled “Nondestructive Evaluation: Theory, Techniques, and Applications” Marcel and Dekker, Inc., 2002. He is the co-author of over 600 journal papers, conference proceedings and presentations and technical reports.
He served as the Editor-in-Chief of the IEEE Transactions on Instrumentation and Measurement (2007-2011), two terms as an at-large AdCom member of the IEEE Instrumentation and Measurement (I&M) Society, I&M Society President (2014-2015) and serves as an I&M Society Distinguished Lecturer. He served as the General Co-Chair of the 2013 IEEE Instrumentation and Measurement Technology Conference (I2MTC). In 2015 and 2017 he served on the IEEE Technical Activities Board (TAB) Publications Services & Products Board (PSPB), and was elected as an at-large IEEE PSPB member (2016-2018).
He has eighteen issued US patents to his credit (with several issued abroad) in the field of microwave nondestructive testing and evaluation. He has delivered numerous Invited and Keynote presentations on the subject of microwave and millimeter wave nondestructive testing and imaging.
He is a Fellow if the Institute of Electrical and Electronics Engineering (IEEE) and also a Fellow of the American Society for Nondestructive Testing (ASNT).