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Steve Tilden (SM) became the chairman of Technical Committee 10 (Waveform Generation, Measurement & Analysis) of the Instrumentation & Measurement Society on 1 November 2013. He was previously chairman for both the ADC & DAC standards committees since inception that published IEEE-STD-1241-2000 & -2010 & IEEE-STD-1658-2011 and on working groups for Std-1057, 181 & 1696. Steve is the President & CEO of Tilden Consulting Corporation since October 2014. Steve was formerly the Director of Markets & Technologies at LTX-Credence Corp. since March 2009 where he helped solve customer test and cost challenges. His prior 30 years in industry was at Burr-Brown which Texas Instruments acquired in 2000 where he designed Analog-to-Digital Converters & included test & management positions including Burr-Brown Test Technology Development Manager. At TI, he set High Performance Analog world-wide test strategies and moved HPA offshore testing from Taiwan OSATs’ to internal factory in Kuala Lumpur, Malaysia while an expatriate. Steve completed his BSEE studies at the University of Maryland, College Park and is an IEEE Senior Member.