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Dr. Zheng Liu received his doctorate in engineering from Kyoto University (Kyoto, Japan) in 2000 and was awarded a second Ph.D. from the University of Ottawa in 2007. From 2000 to 2001, he was a research fellow with the control and instrumentation division of Nanyang Technological University (Singapore). He then joined the Institute for Aerospace Research (IAR), National Research Council Canada (Ottawa, ON, Canada) as a governmental laboratory visiting fellow. After being with IAR for five years, he transferred to the NRC Institute for Research in Construction, where he is currently holding a research Officerss position. His research interests include image/data fusion, computer vision, pattern recognition, senor/sensor network, structural health monitoring, and non-destructive inspection and evaluation. Dr. Liu is a senior member of IEEE and member of SPIE. He is co-chairing the IEEE IMS TC-36. He holds a professional engineer license in Ontario. Since 2012 Professor Liu joined Toyota Technological Institute, the Intelligent Information Processing Laboratory.