Jointly Financially Co-Sponsored by the IEEE Instrumentation and Measurement Society and by Keithley Instruments, Incorporated
The IEEE Joseph F. Keithley Award in Instrumentation & Measurement award is presented for outstanding contributions in electrical measurements. It was established in 2001 and was presented for the first time in 2004. It is awarded by the IEEE.
The award recipient is invited to receive the award and deliver a keynote address at the annual International Instrumentation and Measurement Technology Conference (I2MTC) or one of the I&M Society jointly co-sponsored conferences.
To nominate, please go to: http://www.ieee.org/about/awards/tfas/keithley.html
Suggestions for strengthening nominations (not all inclusive):
- When a candidate's accomplishments are within a team of people, the individual's unique accomplishment must be specifically and clearly delineated. The committee considers the individual candidate's accomplishments and not that of a group unless the entire group is nominated.
- Nominations must specifically and clearly show influence of one's innovation/accomplishment in a broad manner, not just in academia, or just in a narrow industrial application, etc. In addition, specific statements must be included indicating the impact of one's work in a broad way.
- The reference letters should also possess broadness by asking people who are keenly familiar with the candidate's work (from industry, academic, national/government labs, etc.). Also they must point to SPECIFIC impacts and not generality of the candidate's work.
- Global nature of one's impact of work is also very important.
For a list of IEEE Joseph F. Keithley Award in Instrumentation and Measurement recipients, please go to: http://www.ieee.org/documents/keithley_rl.pdf.