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Report of 2016 IEEE First International Conference on Control, Measurement & Instrumentation (CMI)

Report of 2016 IEEE First International Conference on Control, Measurement & Instrumentation (CMI)
January 8-10, 2016, Kolkata, India
 
Organized By: IEEE Joint CSS-IMS Kolkata Chapter, India
In collaboration with Jadavpur University, India
 
Technical Co-sponsor: IEEE IMS USA
 
 
1. Summary of lectures:
 
(A) Keynote speaker:
 
1. Prof. Wuqiang Yang, University of Manchester, UK, IEEE Fellow, 
Distinguished Lecturer, IEEE Instrumentation & Measurement Society, USA 
Title of the Talk: Electrical Capacitance Tomography and Industrial Applications
 
(B) Plenary Speakers:
 
1. Prof. Bikash Pal, Imperial College London, UK, IEEE Fellow
Editor-in-Chief, IEEE Transactions on Sustainable Energy
Title of the Talk: Role of Control and Measurement in Future Power Networks
 
2. Prof. Huijun Gao, Harbin Institute of Technology, China, IEEE Fellow
Co-Editor-in-Chief, IEEE Transactions on Industrial Electronics
Title of the Talk: Networked Control Systems with Application to Industrial Processes
 
3. Prof. Bijnan Bandyopadhyay, Institute Chair Professor, Indian Institute of Technology (Bombay) India, 
Distinguished Visiting Fellow, Royal Academy of Engineering, London
Title of the Talk: Higher Order Sliding Mode Control – A new Research Paradigm
 
4. Prof. Laxmidhar Behera, Indian Institute of Technology (Kanpur) India 
Member, Technical Committee on Intelligent Control, IEEE CSS.
Title of the Talk: Learning to Control Visually Guided Robotic Systems
 
(C) Contributory papers: Total papers 105 were accepted, presented in 18 technical Sessions. 
 
(D) Technical Program Committee:
 
The TPC consisted on 128 researchers from reputed institutions all over the world.
 
(E) Tutorial Session:
 
Conducted by Professor Amit Konar, Professor of Electronics & telecommunication Engineering, Jadavpur University.
 
(F) Proceedings: 
 
The Conference e-proceedings was published with ISBN: 978-1-4799-1768-6. The presented papers are now available in IEEEXplore Digital Library with iSBN: 978-1-4799-1769-3.