| Technical Committees |
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The currently active Technical Committees are listed below. For more information, please contact John L. Schmalzel, VP Technical Operations of the I&M Society.
TC-1 Measurement Precision, Sensitivity, and Noise TC-2 DC-LF Measurement TC-3 Frequency and Time TC-5 Connectors in Measurements TC-6 Emerging Technologies in Measurements TC-7 Signals and Systems in Measurement TC-8 Test and Instrument Systems TC-9 Sensor Technology TC-10 Waveform Generation, Measurement and Analysis
TC-13 Wireless and Telecommunications in Measurements TC-15 Virtual Systems in Measurements TC-16 Laser and Optical Systems in Measurements TC-17 Materials in Measurements TC-18 Environmental Measurements TC-19 Imaging Measurements TC-20 Transportation Systems in Measurements TC-21 Self-Test and Built-in Test TC-22 Intelligent Measurement Systems TC-23 Education for Instrumentation and Measurement TC-24 Measurement Microsystems TC-25 Medical and Biological Measurements
TC-27 Human-Computer Interfaces and Interaction TC-28 Instrumentation for Robotics & Automation TC-30 Security and Contraband Detection TC-31 I&M for Homeland Security TC-32 Fault Tolerant Measurement Systems TC-33 Characterization of Electrical and Optical Nonlinear High Frequency Components TC-34 Nanotechnology in Instrumentation and Measurement TC-35 Netcentric Operations Interoperability TC-36 Industrial Inspection TC-37 Measurements and Networking TC-38 Space Measurements TC-39 Measurements in Power Systems |
