You are here

Award Recipients

    Project Title: Active microwave thermography for nondestructive evaluation of surface cracks in metal structures
    Faculty Advisor: Kristen Donnell

    Project Title: Novel Substrate Integrated Waveguide Sensor for Determining Complex Permittivity of Biomass
    Faculty Advisor: Dr. Samir Trabelsi

    For significant contributions in instrumentation & measurement for underground nuclear testing, which helped the USA win the Cold War, and for monumental technical and administrative contributions to IEEE standards on waveform recorders, analog-to-digital

    Project Title: Condition Monitoring of Rotating Machinery using Strip Electrostatic Sensor Arrays
    Faculty Advisor: Professor Yong Yan

    For outstanding contributions to the Society as IMTC 1998 General Chair, I2MTC 2013 General Co-Chair, I2MTC Board of Directors Chair, Administrative Committee VP of Education, as well as his Society leadership over many years at the local section level.

    Project Title: Assurance of traceability for smartphone--‐based kinetic measurements
    Faculty Advisor: Prof. Pasquale Daponte

    For half a century of leadership, advancing state-of-the-art test and measurement instruments

    Nicholas Erickson Photo
    Project Title: De-embedding Techniques for Device Characterization
    Faculty Advisor: Jun Fan, Missouri University of Science & Technology

    Mohammad Tayeb Ghasr Photo
    For contributions to the development of real-time millimeter wave imaging systems for nondestructive evaluation applications

    Project Title: Photonic Time Stretch Based Real-time Instruments for High Bandwidth Signal Characterization
    Faculty Advisor: Asad M. Madni, UCLA

    Headshot Photo
    For outstanding contributions to the advancement and implementation of safety and security monitoring instrumentation and measurement technologies

    For eighteen years of outstanding leadership on the Society’s AdCom, including service on the IMS Fellow Review Committee, as Chair of the I2MTC Board, Vice President for Publications, President, Junior Past President, Senior Past President, and Editor-in

    For leadership and innovation in industry-focused engineering education and research in electronic test technology

    Robert X. Gao Photo
    For significantly advancing the state-of-the-art in electrical capacitance tomography instrument design.

    Massimo D'Apuzzo Photo
    For lifelong activity and outstanding achievement in pioneering the use of microcontrollers in electrical measurements.

Pages