I feel really pleased and honored to introduce myself as the incoming Editor-in-Chief of the IEEE Transactions on Instrumentation and Measurement. When Professor Zoughi told me that the AdCom of the IEEE Instrumentation and Measurement Society had appointed me in this position, two thoughts came to my mind.
The first one: Even trying to be as good as Reza has been in his term is a tremendous responsibility for me. The second thought brought me back to the beginning of my career, when I submitted my first paper to this Transactions. At that time the submission web site was long to come, and I had to ship four hard copies of my manuscript to the EIC by regular mail. To me, a young and inexperienced guy, the EIC was a sort of mythological entity, with overwhelming power on my poor manuscript, and not even in my most optimistic moments could I imagine one day I would serve in that position. Looking back to that time, I realize how much we have progressed: The submission process is maybe less romantic, but much more efficient. And now I know for sure that the EIC is far different from what appeared to me!
Professor Zoughi’s message is the clearest evidence of how this journal has progressed and improved. I fully agree with his vision and I do share his target of quality. Thanks to his hard work, well supported by the Associate Editors, the Reviewers and the Staff Members, this journal has improved in every respect, from the so called bibliometric indices (Impact Factor, Immediacy Index, Cited Half-Life) to the number of published articles and the feedback we receive from our readers. I am not a fan of these indices, but I have to recognize that they are somehow related to the overall quality of a journal, and their improvement has to be pursued. However, I do think that they are the effect of an increased quality, and not the origin of a higher quality. Therefore I wish to assure you that this journal will never try to increase them in a surreptitious way, as it has unfortunately become the habit of some low-quality journals, by asking Authors to add a minimum number of references to TIM-published articles. On the contrary, I will spend time and energy to make sure that the overall quality of the TIM will improve in the only acceptable way: through a timely and strict review process, driven by the most competent and meticulous Associate Editors, and assigned to competent Reviewers, whose comments will invaluably help Authors to improve their papers.
Thanks to Reza, we have set this course many years ago, and I will do my best not to divert from it. I also know that I can rely on his precious support and advice from his new position of Past Editor-in-Chief. This will ensure a smooth transition and will greatly help me to realize the initiatives we planned to further improve the quality of this journal. As Reza wrote when he was appointed EIC, we will make it the most desirable journal people active in the field of Instrumentation and Measurement can find to publish the results of their work.
The first initiative we are starting next year is the publication of a number of special issues, or special sections in regular issues, dedicated to specific, state-of-the-art, time-sensitive and important topics in the field of interest of this Transactions, where the top specialists of these topics can expose their perspectives and the last scientific findings in the field. The first of these issues, that we plan to publish by the end of 2012, is dedicated to the fundamentals of the measurement science; fundamentals which are too often neglected to privilege more immediate results achieved in the design of innovative instruments.
We think that a reflection on the fundamental issues of metrology would be of great interest for our readers, also in view of the quite probable change in the SI (the International System of Units) that the CGPM (the Conférence Générale des Poids et Mesures) will approve in its next meeting in 2015.
I hope that these Special Issues will help us to better serve our readers. Too often we forget that a journal, even a scientific journal, can survive only if it meets the expectations of its readers and is fruitful to them. Too often scientific journals are managed having only authors in mind. However, authors, before being authors, were readers; and every new work is – and shall be – inspired by a thorough literature search. New results shall always be validated by comparing them with the already existing ones. Moreover, today’s readers will probably be tomorrow’s authors. If we offer them a qualified, broad insight on the most innovative works in the Instrumentation and Measurement field, we not only serve them, but we also contribute to educate new generations of authors, thus ensuring a bright future for this journal.
All this can be achieved through constant feedback from our readers. So, please, do not hesitate to contact me with your comments, complaints and suggestions. They will surely help me in making this Transactions more and more useful and desirable.
Let me now conclude with a warm thank you to Reza for the wonderful job he has done and for the honor of this nomination. Let me thank the AdCom of the Instrumentation and Measurement Society for having appointed me to this challenging position. Let me also thank the wonderful team of Associate Editors and Reviewers for their hard, and mostly obscure work. They have most of the merit for the present quality of this journal and I hope they will continue cooperating with me in the same great way they did with Reza. Last but not least, let me thank two wonderful ladies: Ms. Cam Ingelin and Ms. Reta Wehmeier, whose competent, meticulous and tireless work is absolutely invaluable.
Alessandro Ferrero (M’88–SM’96–F’99) was born in Milan, Italy, in 1954. He received the M.Sc. degree in electrical engineering from Politecnico di Milano in 1978. In 1983, he joined the Dipartimento di Elettrotecnica, Politecnico di Milano, as an Assistant Professor of electrical measurements. From 1987 to 1991, he was with the University of Catania, Catania, Italy, as an Associate Professor of measurements on electrical machines and systems. From 1991 to 1994, he was with the Dipartimento di Elettrotecnica, Politecnico di Milano, as an Associate Professor of electrical measurements, where he has been a Full Professor of electrical and electronic measurements since 1994. His current research interests include uncertainty evaluation, the application of digital methods to electrical measurements and measurements on electric power systems under nonsinusoidal conditions. Prof. Ferrero is a member of the Italian Association of Electrical and Electronic Engineers and the Italian Association for Industrial Automation. He has chaired the Italian Association for Electrical and Electronic Measurements for the three-year term 2004–2007 and he has been the President of the IEEE Instrumentation and Measurements Society for the 2008 – 2009 term. In 2011 he has been elected Foreign Member of the Royal Flemish Academy of Belgium for Science and the Arts, in the Class of the Technical Sciences. He is the recipient of the 2006 Joseph F. Keithley IEEE Field Award for Instrumentation and Measurement.
2011 was another busy year and my fifth year of serving as the Editor-in-Chief (EIC) of the IEEE Transactions on Instrumentation and Measurement (TIM). As in the past year, we focused on improving the technical quality of our published papers through a rigorous and timely review process. I would like to take this opportunity and highlight some of our accomplishments during 2011*.
We continued our “Best Practice” of identifying and recognizing our best reviewers by sending them individual ”Thank You” letters and certificates of appreciation, and for some a follow-up letter to their supervisors or department chairs.
Published approximately 4000 pages.
Continued publication of the annual I2MTC Special Issue in May.
Continued working diligently on publishing accepted papers within twelve month of initial submission.
Several I&M Society-sponsored Special Issues were granted and several were published as well.
Continued monthly posting of TIM’s review-process and timeliness metrics. See the I&M Society web site (http://www.ieee-ims.org/main/) and on the transactions page click on “Current TIM Metrics”.
The “upcoming issue table-of-contents” continues to be posted on the Society’s Transactions web page in order to assist authors in better tracking the publication date of their papers.
Review-Process Timeliness Metrics – At the time of writing this message (September 2011) our reviewer-process timeliness metrics for regular papers during the past twelve months are: average days to initial decision, 64; average days to final decision, 111; percentage of submitted papers that are accepted for publication, 41%; percentage of papers with initial decision rendered in 120 days, 95%; percentage of papers with initial decision rendered in 180 days, 99% and percentage of papers with final decision rendered in 180 days, 83%. For a complete list of these metrics and those for Special Issue and Short Papers, please see the I&M Society web site and on the transactions page and click on “Current TIM Metrics”.
Submission-to-Epublications Metric – This is an area that we have made significant improvement. The number of weeks that it took for a paper to be rapid-posted from the date of submission in 2008, 2009 2010 and 2011 (up until September) was 59, 44 and 35 and 22 weeks, respectively.
Impact Factor – The increase in TIM’s Impact Factor in 2009 was followed by another increase in 2010 from 1.025 to 1.098. In 2009 Impact Factor Minus Self-Cites started being calculated and reported. TIM’s corresponding numbers in 2009 and 2010 were 0.766 and 0.895, respectively.
Andy Chi Best Paper Award – Subsequent to updating the Andy Chi’s Best Paper Award selection process, it was awarded in 2011 and will continue to be awarded annually.
Plagiarism, Dual/Multiple Submission, etc. – In 2011 we had several cases that had (potentially) fallen under this category. As a critical element of the submission process, the contact authors are required to certify the following:
“By initialing below, on behalf of all authors, I certify that the manuscript being submitted is based on original materials, and/or one with substantially similar content under my/our authorship, has not been published, or is currently being considered for publication elsewhere, or will not be submitted elsewhere unless this submission is Rejected or has been Withdrawn from consideration, except as described in a cover letter which must be submitted along with the manuscript (see below for Cover Letter submission). IEEE rules governing issues related to plagiarism, dual submission, etc. can be found at HERE. By initialing below, the author(s) also certify having familiarized themselves with these rules. Substantial publications sanctions may be imposed on ALL authors if these rules are violated.”
We have an active Ad-Hoc committee that considers potential violations, and after evaluating the facts of each case, renders a decision and a recommendation of possible sanctions. It is important to note that depending on the degree to which IEEE Rules may be violated, all authors could lose their publishing privileges in all IEEE journals for up to five years.
Reviewers – Reviewers are the cornerstone of timeliness and quality. The most important function of a reviewer is to provide objective, substantial and technically correct and relevant comments in order to help authors improve the overall quality of their papers. We are extremely grateful to all of our reviewers who spent many selfless hours reviewing papers and providing objective comments. You will find the names of those who reviewed papers during 2011 following this message, and to all of them I extend my most sincere expressions of gratitude and appreciation. We will also continue the recognition of our Best Reviewers by sending them individual “Thank You” letters and certificates of appreciation. I would like to repeat a request I have made since 2009: To those of you who receive requests to review papers, I would like to ask the following. When you receive such a request, please quickly decide whether or not you will be able to review the paper in the requested timeframe (usually three weeks). If you accept, please make every effort to finish and upload your review on time. If you are going to be unexpectedly late, please inform the associate editor and Ms. Ingelin or Ms. Wehmeier and request additional time. However, if you decide that you will be unable to review (for any reason) please “decline” immediately (and perhaps hopefully suggest another reviewer). In this case, the associate editor can expeditiously seek another reviewer. The fact of the matter is that a timely decline-to-review is as important as a timely review.” We will continue to proactively monitor reviewer timeliness and update our list of reviewers accordingly (i.e., remove unresponsive reviewers).
Associate Editors – I cannot emphasize enough, the importance of the selfless and professional works of our associate editors in making each issue of TIM possible. Consequently, we decided to formally recognize a number of our associate editors, on an annual basis. Therefore, in 2011 and at the I2MTC awards luncheon, several associate editors were recognized for their outstanding works during the previous year by receiving a nice plaque. In addition, the overlength charges for up to four pages have been waived for papers co-authored by them within two years of this recognition. The recognition of outstanding associate editors is now a regular annual event.
Transactions Five-Year Review – In early 2012 we will have our five-year review of the transactions by the IEEE. In the next few months we will be working on preparing the needed materials for this review.
Final Thoughts & Reflections on the Past Five Years –As in years past, I am extremely grateful to Ms. Cam Ingelin who meticulously and expertly processes papers from the minute they are submitted to the final step of publication. I also like to thank Ms. Wehmeier who has been tirelessly helping everyone who has needed help, and in particular for relieving me of some administrative duties, so that I can spend my time on more broad-reaching issues related to the transactions. I wish to thank the I&M Society AdCom and Dr. S. Mandayam (Publications Vice President) for their continued support of TIM by providing thoughtful suggestions. As in the past year. Ms. Sara Scudder at the IEEE is responsible for receiving our accepted papers from Allentrack and facilitate their eventual publication in TIM. I am grateful to her for being extremely professional, proficient and responsive to our needs.
At the Spring 2011 AdCom meeting, I introduced a motion to establish a five-year term limit for the EIC. There are a number of very capable individuals who should be given the opportunity to take the state of our transactions to the next level. In addition, I nominated Professor Alessandro Ferrero as the next EIC of the transactions starting in 2012, and the AdCom resoundingly approved his appointment. Professor Ferrero has been an associate editor and a prolific author of papers in TIM for many years. He is very familiar and knowledgeable about the various aspects of manuscript submission and review process. He has been my “sounding board” since I started serving as the EIC. He is a fair colleague who has very similar goals and objectives for the transactions that I do. To both of us “Quality” in all aspects of this entire process is of paramount importance. Consequently, since his appointment as the next EIC he has been serving as the Associate EIC, and hence actively performing the duties of EIC including assigning associate editors and rendering final decisions. After five years, I leave this position knowing that we have the best person in charge. Please join me in welcoming professor Ferrero as the new Editor-in-Chief of the IEEE Transactions on Instrumentation and Measurement (TIM). I look forward to working with him in 2012 and years beyond.
Finally, I would like to believe that during that past five years we have made some distinct and significant improvements to the overall state the transcations. I am most grateful to all who helped in achieving most of our goals that were set five years ago.
Reza Zoughi Editor-in-Chief
* This message was prepared using some relevant parts of my message from 2010 since many aspects of the message have remained the same.
R. Zoughi (S’85-M’86-SM’93-F’06) received his B.S.E.E, M.S.E.E, and Ph.D. degrees in electrical engineering (radar remote sensing, radar systems, and microwaves) from the University of Kansas where from 1981 until 1987 he was at the Radar Systems and Remote Sensing Laboratory (RSL). Currently he is the Schlumberger Endowed Professor of Electrical and Computer Engineering at Missouri University of Science and Technology (Missouri S&T), formerly University of Missouri-Rolla (UMR). Prior to joining Missouri S&T in January 2001 and since 1987 he was with the Electrical and Computer Engineering Department at Colorado State University (CSU), where he was a professor and established the Applied Microwave Nondestructive Testing Laboratory (amntl). Dr. Zoughi held the position of Business Challenge Endowed Professor of Electrical and Computer Engineering from 1995 to 1997 while at CSU. He is also a Fellow of the American Society for Nondestructive Testing (ASNT). He is the recipient of the 2011 IEEE Joseph F. Keithley Award in Instrumentation & Measurement.
THE YEAR 2010 was another busy year. We continued striving for excellence in several areas, in particularly, as it relates to improving the technical and overall quality of papers published in the IEEE Transactions on Instrumentation and Measurement (TIM). This was achieved by paying particular attention to this issue throughout the submission and review processes. I would like to take this opportunity and highlight some of our accomplishments for 2010.
Recognition of our "Best Reviewers" by sending them individual "Thank You" letters and certificates of appreciation. I consider this a best practice, and we have received extremely positive responses to this type of well-deserved recognition.
Published approximately 3450 pages, with the goal of reducing the number of papers in the publication queue.
Continued publication of the annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Special Issue in May.
Added several new associate editors in the areas that we lacked expertise.
Introduced a two-year term for associate editors, with a possible term extension.
Several Instrumentation and Measurement (I&M) Society-sponsored special issues were granted, and several were published as well.
Processed two large special issues, namely, the 2010 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Special Issue and the 2010 Conference on Precision Electromagnetic Measurements Special Issues.
Continued monthly posting of the TIM's review-process timeliness metrics. See the I&M Society website http://www.ieee-ims.org/main/, and on the Transactions page, click on "Current TIM Metrics". We also added the Submission-to-E-publication timeliness metric to the list.
The "upcoming-issue table of contents" is continuously being posted on the Society's Transactions web page in order to assist authors in better tracking the publication date of their papers. Digital Object Identifier 10.1109/TIM.2010.2080370
Finally, we began publishing papers grouped under several technical areas. This is intended to make it easier for our readers to quickly find papers in their technical areas of interest.
Review-Process Timeliness Metrics: At the time of writing this message (September 2010), our reviewer-process timeliness metrics for regular papers during the past 12 months are the following: average days to initial decision, 64; average days to final decision, 120; percentage of submitted papers that are accepted for publication, 50%; percentage of papers with initial decision rendered in 120 days, 93%; percentage of papers with initial decision rendered in 180 days, 99%; and percentage of papers with final decision rendered in 180 days, 82%. As I stated in my 2009 message, I believe we should strive toward improving the last statistic (surpassing the 90% mark). For a complete list of these metrics and those for special issues and short papers, please see the I&M Society website, and on the Transactions page, click on "Current TIM Metrics".
Submission-to-E-publication Metric: This is an area where we have made a significant improvement. The number of weeks that it took for a paper to be rapid-posted from the date of submission in 2008, 2009, and 2010 (up until September) were 57, 37, and 21 weeks, respectively.
Impact Factor: The increase in the TIM's Impact Factor in 2008 was followed by another increase in 2009 from 0.978 to 1.025, with a corresponding increase in the five-year Impact Factor from 1.138 to 1.150. The Immediacy Index and Cited Half-Life metrics also improved to 0.170 and 8.1, respectively. We look forward to the further improvement in all of these metrics when the 2010 scores become available in mid-2011.
Andy Chi Best Paper Award: We updated and revised the guidelines for the Andy Chi Best Paper Award. We were not able to present this award in the past two years due mostly to the publication timing of eligible papers. However, using the Allentrack system has made this process much more efficient. The process involves nominations for the Best Papers by the associate editors (considering inputs from the reviewers). Subsequently, the Best Paper Selection Committee, formed by the editor-in-chief, selects the Best Paper from among the candidate papers. The next award will be presented at the 2011 I2MTC.
Plagiarism, Dual/Multiple Submission, etc.: In 2010, we had several cases that had (potentially) fallen under this category. As a result, the submission page on Allentrack was updated to remind authors about this important issue. As a critical element of the submission process, the contact authors are required to certify the following: "By initialing below, on behalf of all authors, I certify that the manuscript being submitted is based on original materials, and/or one with substantially similar content under my/our authorship, has not been published, or is currently being considered for publication elsewhere, or will not be submitted elsewhere unless this submission is Rejected or has been Withdrawn from consideration, except as described in a cover letter which must be submitted along with the manuscript (see below for Cover Letter submission). IEEE rules governing issues related to plagiarism, dual submission, etc. can be found at HERE. By initialling below, the author(s) also certify having familiarized themselves with these rules. Substantial publications sanctions may be imposed on ALL authors if these rules are violated."
We also updated the Allentrack submission process so that everytime a paper is submitted; all authors receive a notification of the submission. This was done to help partially alleviate potential problems with the submission of a paper on behalf of another person(s) and possibly without their knowledge.
We have an active ad hoc committee that considers potential violations and, after evaluating the facts of each case, renders a decision and a recommendation of possible sanctions. It is important to note that, depending on the degree to which IEEE rules may be violated, all authors could lose their publishing privileges in all IEEE journals for up to five years.
Reviewers: Reviewers are the cornerstone of timeliness and quality. The most important function of a reviewer is to provide objective, substantial, and technically correct and relevant comments in order to help authors improve the overall quality of their papers. We are extremely grateful to all of our reviewers who spent many selfless hours reviewing papers and providing objective comments. You will find the names of those who reviewed papers in 2010 after this message, and to all of them, I extend my sincerest expressions of gratitude and appreciation. We will also continue the recognition of our Best Reviewers by sending them individual "Thank You" letters and certificates of appreciation. I would like to repeat a request I made in 2009. To those of you who receive requests to review papers, I would like to ask the following: When you receive such a request, please quickly decide whether you will be able to review the paper in the requested time frame (usually three weeks). If you accept, please make every effort to finish and upload your review on time. If you are going to be unexpectedly late, please inform the associate editor and Ms. Cam Ingelin or Ms. Reta Wehmeier and request for additional time. However, if you decide that you will be unable to review (for any reason) please "decline" immediately (and perhaps hopefully suggest another reviewer). In this case, the associate editor can expeditiously seek another reviewer. The fact of the matter is that "a timely decline-to-review is as important as a timely review." We continue IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT to proactively monitor reviewer timeliness and update our list of reviewers accordingly (i.e., remove unresponsive reviewers).
Associate Editors: I cannot emphasize enough the importance of the selfless and professional works of our associate editors in making each issue of the TIM possible. Consequently, we have decided to formally recognize a number of our associate editors, on an annual basis. Therefore, starting in 2011, at the I2MTC awards luncheon, several associate editors will be recognized for their outstanding works during the previous year by receiving a nice plaque. In addition, the overlength charges of up to four pages may be waived for papers co-authored by them.
New Transactions Assistant Administrator: In 2010, we welcomed Ms. Reta Wehmeier (firstname.lastname@example.org) as a the new member of our transactions administrative team. Ms. Wehmeier's responsibilities include the following: assisting associate editors with contacting reviewers, reminding associate editors on papers that are ready for decision and need to be expedited, reminding authors about the timely submission of revised papers, collecting monthly and quarterly timeliness statistics, and assisting the plagiarism ad-hoc and the Best Paper selection committees. She also assists Ms. Cam Ingelin with various other tasks related to the submission process. Ms. Wehmeier's addition to the team has already paid significant dividends, and we are thrilled to have her as part of our team.
Final Thoughts: As in years past, I am extremely grateful to Ms. Cam Ingelin who meticulously and expertly processes papers from the minute they are submitted to the final step of publication. I would also like to thank Ms. Wehmeier who has been tirelessly helping everyone who has needed help, and in particular, for relieving me of some administrative duties, so that I can spend my time on more broad-reaching issues related to the Transactions. I wish to thank the I&M Society Ad hoc Committees and Dr. Ruth Dyer (Publications Vice President, 2010) for their continued support offor the TIM by providing thoughtful suggestions. As in the past year, Ms. Sara Scudder at of the IEEE is responsible for receiving our accepted papers from Allentrack and facilitating their eventual publication in TIM. I am grateful to her for being extremely professional, proficient, and responsive to our needs.
I look forward to another successful year, and in the meanwhile, please feel free to contact me with your suggestions and comments.
REZA ZOUGHI, Editor-In-Chief
Reza Zoughi (S '85 - M '86 - SM '93 - F '06) received the B.S.E.E, M.S.E.E, and Ph.D. degrees in electrical engineering (radar remote sensing, radar systems, and microwaves) from the University of Kansas, Laurence. From 1981 to 1987, he was with the Radar Systems and Remote Sensing Laboratory, University of Kansas. From 1987 to 2001, he was a Professor with the Department of Electrical and Computer Engineering, Colorado State University (CSU), Fort Collins, where he established the Applied Microwave nondestructive Testing Laboratory. From 1995 to 1997, he was the Business Challenge Endowed Professor of electrical and computer engineering with CSU. He is currently the Schlumberger Endowed Professor of electrical and computer engineering with Missouri University of Science and Technology, Rolla, formerly the University of Missouri-Rolla. Dr. Zoughi is a Fellow of the American Society for Nondestructive Testing.
The following guidelines detail the process leading to publication of Special Issue Sections in the IEEE Transactions on Instrumentation and Measurement (TIM) for conferences and workshops sponsored (technically and/or financially) by the Instrumentation and Measurement Society (IMS).
* Conferences and workshops MUST contact the transactions editor-in-chief (EIC) and request a Special Issue immediately after their request for sponsorship from the society has been approved and not later (in particular not after the conference has taken place).
* The EIC makes a determination as to whether or not a Special Issue will be assigned to the conference or workshop based on considering several pertinent factors (including but not limited to the technical scope of the conference, request timeliness, etc.). There three options that may be considered: 1) the guest editor acts as the associate editor and will monitor the review process, 2) the guest editor only quality checks the submitted papers for whether the papers are technically extended beyond the proceedings copy and also whether the authors registered (full registration) and presented the paper (oral or poster) at the conference and then the Editor-in-Chief assigns the papers to the regular associate editors who will handle the review process, and 3) no special issue will be assigned and authors will be asked to submit their extended papers, still fulfilling the special issue requirements, and the papers will be reviewed as "regular" papers and will publish the accepted papers under the common technical area grouping. Consistent with options #1 and #2, guest editor(s) will be given associate editor permission in the web-based manuscript submission and review process system used by TIM (http://tim.allentrack.net).
* If the publication of a Special Issue has been approved by the EIC, conferences and workshops MUST immediately and clearly advertise (in their web site, brochures, announcements, etc.) the fact that all papers, independent of the mode of presentation (i.e., oral or poster), that are presented at the conference with at least one author having paid full registration fee, are eligible to be considered for the Special Issue. Any exceptions (limited and such as conference-sponsored keynotes and invited speakers, etc.) must be approved by the society vice president for conferences and the transactions EIC. In addition, the conference or workshop MUST identify a two-week period, after the conference has taken place (usually about four weeks after the conference), during which (and only in this period) the authors may upload their extended Special Issue papers.
* The conference or workshop MUST identify one or two individuals as the guest editor(s) for the Special Issue. The guest editor(s) will in turn assemble a group of at least three individuals as the "Special Issue Selection Committee". It is strongly suggested that the organizers and guest editors contact TIM EIC, Professor Alessandro Ferrero, as soon as possible for planning purposes and with any questions they may have.
* Only a maximum of ten papers from any given conference or workshop will be published in the Special Issue section of TIM. However, since many more papers may be submitted, the remaining reviewed and accepted papers will appear in an upcoming regular issue of TIM. There are additional requirements for ALL papers (Special Issue and regular) from the conferences and workshops that must be adhered to, as outlined below.
* Paper(s) authored or co-authored by the guest editor(s) are NOT eligible for publication in the Special Issue section. However, once reviewed and accepted they will appear in the next available regular issue.
* The guest editor(s) in consultation with the "Special Issue Selection Committee" will decide which of the ten accepted papers will appear in the Special Issue section.
* The guest editor(s) are expected to prepare an introductory page for the Special Issue (such as those for I2MTC Special Issues).
1. The paper must be TECHNICALLY extended beyond the scope of the paper that may have appeared in the conference or workshop proceedings (if any).
2. At the time of submission, the authors must provide detailed information (in a separate file to be uploaded as part of the submission process) regarding how the paper is a technically extended version of the proceedings paper.
3. The proceedings paper MUST be clearly referred to in the text and listed as one of the references in the special-issue paper.
4. A PDF copy of the proceedings paper must be submitted at the time of special-issue paper submission.
5. It is the responsibility of the author(s) to obtain permission to re-use and re-print materials from the proceedings paper and this permission must be obtained ahead of time from its publisher. An acknowledgement and permission statement required by the proceedings paper publisher must be properly incorporated in the Special Issue paper. The author(s) is (are) solely responsible for this and any other copyright permission-related requirements and issues. If the proceedings paper was copyrighted by the IEEE, this permission is not required.
6. When uploading your manuscript click on "Special Issue Manuscript" in the "Manuscript Upload Instructions" page of the Allentrack System. Then, in page #1 of "Submit Manuscript" you must choose your specific Special Issue. Subsequently, in the same page and in the "Files to Upload" section you MUST upload two files; one containing a detailed explanation of how the paper is TECHNICALLY extended beyond the scope of the proceedings paper and another which is a PDF copy of the Conference/Workshop Proceedings paper. To this end, you must put the number "2" in the small box in front of "Extension Beyond Proceedings & Copy of Proceedings" (if any was published) so that the system allows you to upload these two files. Consequently, these two files will be available to the reviewers. Failure to submit a detailed explanation of the TECHNICAL extension and a PDF copy of the Proceedings paper will result in the immediate return of the manuscript to the author(s) as an unacceptable submission.
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of theses papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
The Journal of Lightwave Technology - Published monthly, the Journal is concerned with research, applications, and methods used in all aspects of lightwave technology and fiber optics.
The IEEE Sensors Journal - The bimonthly publication specializes in the theory, design, fabrication, manufacturing, and applications of devices for sensing and transducing physical, chemical, and biological phenomena.
The IEEE Transactions on Nanotechnology - This quarterly journal is devoted to the dissemination of new results and discussions related to understanding the physical basis and engineering applications of phenomena at the nanoscale level.
The IEEE Transactions on Mobile Computing - Research papers are presented in this quarterly publication dealing with mobile computing, wireless networks, reliability, quality assurance, distributed systems architecture, and high-level protocols.
The IEEE Press Books - The IEEE I&M Society underwrites and sponsors books on topics of keen interest. The Society has published books on the history of electronic instrumentation and the development of electrical and magnetic measurements.
For author's instructions and any further information concerning publications, click the corresponding title.
The I&M Magazine, published bi-monthly, features general interest articles and tutorials on methodologies and applications, as well as the Society news and is included in the Society membership dues. Special issues, from select I&M conferences, publish technical papers on specific "hot" topics. For further information concerning advertising, please click here for the I&M Media Kit. The I&M Magazine is now available online! Please click here to see selected columns, summaries of columns and feature articles from the magazine.
If you are interested in writing a paper for the IEEE Instrumentation and Measurement Magazine, please contact the Editor-in-Chief. To publish a paper of yours, the IEEE needs that you transfer the copyright by using the IEEE Copyright Transfer Form. It is available here in the following formats: