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TC-21 - Self-Test & Built-In-Test
TC:
21
TC Title:
Self-Test & Built-In-Test
The goals of this Committee are to:
Investigate the effectiveness of current Built-in-Test and Self-Test methodologies;
Explore methods of generating improvement in the effectiveness and efficiency of BIT, such as diagnostics, prognostics, inference engine methodology, and Integrated Diagnostics;
Examine new technologies in the application of BIT and Self-Test;
Promote the use of Systems Engineering techniques and methodologies in the overall design process where BIT and self-test are required;
Generate interest in the field by use of workshops and technical meetings to address issues;
Maintain liaison with other groups, societies, and organizations working in the same field.
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Wed, 2013-03-20 02:53
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