The IEEE Instrumentation & Measurement Magazine | IEEE Instrumentation & Measurement Society

I&M MAGAZINE

Aim & Scope

The IEEE Instrumentation & Measurement Magazine covers a wide variety of topics in instrumentation, measurement and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement (IM) to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in IM.

To such aim, the I&M Magazine will only accept articles in 3 specific formats:

Tutorial
Short Review/Roadmap
Short Scientific Communication of an emerging topic

Each format has its own specific author guidelines. Furthermore, it is very important that authors understand the differences between publishing in an IEEE Magazine, or Journal, or Transactions. Supporting resources may be found here.

Important: Following the submission instructions could save your paper from being immediately rejected for being too specialized or out-of-scope.

Articles should be submitted to the Editorial Manager submission system, where the format of the article (Tutorial, Review/Roadmap, Short Scientific Communication) must be specified.

IMM Issues are available through IEEE Xplore and BrightCopy. Please use the links below to access each issue. To access BrightCopy, use your email address as your login ID and your IEEE number as your password.

Upcoming Issues Published Issues

IMM Editor-in-Chief

Melanie Ooi

The University of Waikato

New Zealand

Melanie Ooi

Biography

Melanie Ooi is an emerging researcher and engineering specialist in Electrical and Electronic Engineering as well as Computer Engineering and Computational Intelligence. She is currently an Associate Professor at The University of Waikato, New Zealand. While working in close collaboration with several leading multinational electronics companies, she has developed new testing techniques and test data processing methodologies that have been adopted by the industry partners. In the recent years she has also successfully researched on new measurement uncertainty evaluation approaches and frameworks with application to a multitude of science and technology areas (medical research, structural design, mechanical systems modelling, etc.). Her research competence and capability are evident from the extensive and fast growing list of publications, research grants and projects, as well as successfully supervised postgraduate students.

In addition, Associate Professor Ooi was particularly successful in the area of undergraduate and postgraduate education. She introduced several innovations and a well-structured education program enhancing key professional skills and thus increasing work-readiness and employability of engineering graduates that were successfully adopted and implemented by Monash University and RMIT University in their Southeast Asian campuses. They have been strongly supported by multinational electronics companies such as Intel, Freescale Semiconductor and National Instruments.

Her high professional achievements have been acknowledged by several prestigious awards including the Outstanding Young Engineer Award of the Year 2014 from the IEEE Instrumentation and Measurement Society, 2014 Excellence Award from the International Education Association of Australia, 2011 Citation for Outstanding Contributions to Student Learning from the Australian Learning and Teaching Council to mention a few.

She is Senior Member of the IEEE, Member of the IEEE Instrumentation & Measurement Society (I&MS); I&M AdCom (2019-2022)|| Young Professional Program Representative (2018)|| Distinguished Lecturer (2016 - December 2017), Distinguished Lecturer and Secretary of the Technical Committee on Fault Tolerant Measurement Systems (TC-32) of the IEEE I&MS. She is also Member of the Institution of Engineering and Technology, and UK Chartered Engineer.

Affiliation(s)

The University of Waikato

New Zealand

Editorial Board

View the entire I&M Magazine Editorial Board.

IMM on IEEEXplore

Information for Authors

PeerTrack Submission System

Upcoming Issues

Topics for the 2025 Instrumentation & Measurement Magazine Issues

February 2025: Regular Issue #1
April 2025: I&M Around the World: India (paper submission deadline extended to September 30, 2024)
May 2025: AI-based Industry Instrumentation and Measurement Application Technologies (paper submission deadline September 2024)
June 2025: Regular Issue #2
August 2025: Open Topics in I&M
September 2025: Special Issue: New Insights in Big Data and Sensor Informatics for Traceability-- from Food to Consumers
October 2025: Regular Issue #3
November 2025: Special Issue on AUTOTESTCON 2024
December 2025: Regular Issue #4

Published Issues

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I&M MAGAZINE

Aim & Scope

IMM Editor-in-Chief

Melanie Ooi

Upcoming Issues

Topics for the 2025 Instrumentation & Measurement Magazine Issues

Published Issues

Published Issues

2024 Instrumentation & Measurement Issues:

2023 Instrumentation & Measurement Issues:

2022 Instrumentation & Measurement Issues:

2021 Instrumentation & Measurement Issues:

2020 Instrumentation & Measurement Issues:

2019 Instrumentation & Measurement Issues:

2018 Instrumentation & Measurement Issues:

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