IEEE IMS Best Dissertation Award Selection Committee | IEEE Instrumentation & Measurement Society

Position(s):

Best Dissertation Award Committee Chair

Personnel:

Marco Parvis

Politecnico di Torino

Italy

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Marco Parvis

Biography

Marco Parvis was born in Italy in 1958. He received his MS degree in Electrical Engineering cum laude in 1982 from the Politecnico di Torino, Italy, and a Ph.D. in Metrology in 1987. He is now full professor of Electronic Measurements at Politecnico di Torino. He is Past Dean of the Second Faculty of Engineering and Fellow Member of the IEEE Society on Instrumentation and Measurement. In the same society he is chair of the TC 25 Medical Measurement. His main fields of interest are: intelligent instrumentation, application of signal processing to measurement, biomedical and chemical measurements. At present in cooperation with the Department of Material Science and chemical Engineering he is working on new sensors for mechanical and physical quantities, based on surface modification by plasma sputtering. He is author of more than one hundred publications. I&M AdCom (2018-2021); VP Technical & Standards Activities (2020); TC-25 Chair; || I2MTC Board of Directors (2016-2018)|| I2MTC 2017 Conference Chair|| IEEE Systems Council- Society Representative (2016)

Affiliation(s)

Politecnico di Torino

Italy

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Best Dissertation Award Committee Member

Personnel:

Katelyn Brinker

Iowa State University

United States

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Katelyn Brinker

Affiliation(s)

Iowa State University

United States

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Personnel:

Shibin Wang

Xi'an Jiaotong University

China

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Shibin Wang

Biography

Shibin Wang (M’15) received the B.S. and M.S. degrees in electrical engineering from Soochow University, Suzhou, China, in 2008 and 2011, respectively, and the Ph.D. degree in mechanical engineering from Xi’an Jiaotong University, Xi’an, China, in 2015. He then joined the School of Mechanical Engineering, Xi’an Jiaotong University, where he is an Associate Professor. In 2017, he was a Visiting Scholar at the Tandon School of Engineering, New York University, NY, USA. His research interests include time-frequency analysis and sparsity-assisted signal processing for machine condition monitoring and fault diagnosis.

Affiliation(s)

Xi'an Jiaotong University

China

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Personnel:

Lee Barford

Keysight Technologies

United States

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Lee Barford

Biography

Lee Barford is Master Scientist at Keysight Laboratories, the research arm of Keysight Technologies. His responsibilities include leading research to identify and apply emerging technologies in software, applied mathematics, and statistics to increasing the accuracy and speed of new and existing instruments for electronic, chemical, and biological measurements. Previously, he managed a number of research projects at Agilent Laboratories and Hewlett-Packard Laboratories, for example in visible light and X-ray imaging systems, calibration methods for non-linear and dynamical disturbances, and fault isolation from automatic test equipment results. His work has been used to improve R&D productivity and reduce manufacturing cost in leading companies in the computer, telecommunications, networking, aerospace, and transportation industries. He is the author or co-author of over 40 peer reviewed, international publications and inventor or co-inventor of approximately 60 patents in the US and other countries. During his time at Agilent and Hewlett-Packard, Lee has given invited talks at universities, national laboratories, and research institutes worldwide.

Lee's service on boards includes eight years as president of a charity that provides reduced-cost housing for hundreds of low-income seniors and membership on the blue-ribbon commission for ending homelessness in Silicon Valley.

Affiliation(s)

Keysight Technologies

United States

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