Skip to main content
  • IEEE.org
  • IEEE Xplore®
  • IEEE Standards
  • IEEE Spectrum
  • More Sites
  • Login
  • Join IEEE
  • Donate
IEEE
IEEE IMS logo
  • Home
  • About
    About IMS
    About the I&M Society Contact Us Join IMS
    Committees & Representatives
    IMS Standing Committees Representatives & Liaisons
    Who We Are
    Officers Current Members-at-Large AdCom Members
    History
    Presidents Members-at-Large (by term)
    Governing Documents
    Constitution Bylaws Society Handbook Society Strategic Plan
  • Awards
    Awards & Recognition Program
    About Awards & Recognitions
    Society Awards
    Career Excellence Award Distinguished Service Award Outstanding Young Engineer Award Technical Award J. Barry Oakes Advancement Award Best Application in I&M Award
    Membership Awards
    Best Student Chapter Award Outstanding Chapter Award
    Education Awards
    Graduate Fellowship Award Faculty Course Development Award Best Dissertation Award Undergraduate Student Scholarship International Student Contest
    Technical & Standards Awards
    Outstanding Technical Committee Award
    IEEE
    IEEE Fellows Tips for IEEE Fellow Nominations IEEE Senior Members Joseph F. Keithley Award in I&M
  • Activities
    Technical Activities
    About Technical & Standards Activities Council Memberships Technical Committees Listing Technical & Standards Activity Award Standards Activities
    Educational Activities
    About Educational Activities Education Awards Distinguished Lecturer Program Virtual Distinguished Lecturer Webinars Video Tutorials Program Short Courses Video Library
    Membership Activities
    About Membership Activities Membership Benefits (Join Us) Women in I&M Student Activities Young Professionals Chapters Mentorship Program IMS EPICS in IEEE
  • Publications
    General Information
    About Publications Publications Committee Andy Chi Best Paper Award Cam Ingelin Best Paper Award I&M Society Bookshelf
    Society Publications
    Instrumentation & Measurement Magazine Transactions on Instrumentation and Measurement Open Journal of Instrumentation and Measurement Co-Sponsored Periodicals I&M Society Newsletter
  • Conferences
    General Information
    About Conferences Conferences Committee Organize a Conference
    Society Conferences
    All Events Financially Sponsored Conferences Technically Co-Sponsored Conferences

Search

  • Committee
  • TC-10: Waveform Generation Measurement and Analysis

TC-10: Waveform Generation Measurement and Analysis

Chair

  • Charles Cerny Image

    Charles Cerny

    Email
    Email
  • Charles Cerny Image

    Charles Cerny

    Email
    Email
Subscribe to Our Email List
  • Home
  • Contact
  • Accessibility
  • Nondiscrimination Policy
  • IEEE Ethics Reporting
  • Terms & Disclosures
  • IEEE Privacy Policy
  • Sitemap

© Copyright 2026 IEEE – All rights reserved. A public charity, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.

This site is created, maintained, and managed by Conference Catalysts, LLC