Nicholas Erickson received his B.S. and M.S. degrees in Computer Engineering from the Missouri University of Science and Technology in 2012 and 2013, respectively. He is currently pursuing the Ph.D. degree in Computer Engineering at the Missouri University of Science and Technology, while working as a graduate research assistant at the university’s Electromagnetic Compatibility Laboratory, under the direction of advisor, Jun Fan. His research interests include high-speed digital design, signal integrity, and de-embedding techniques for on-board and on-chip structures.
With the support of the IEEE I&M Fellowship Award, his primary focus has been on the analysis of current on-chip de-embedding techniques, as well as the development of novel techniques for on-chip de-embedding. The goal of this research is to determine the de-embedding method(s) that result in the most accurate characterization of on-chip structures.
Mr. Erickson’s research has resulted in the following conference publications:
- [1] N. Erickson, K. Shringarpure, J. Fan, B. Achkir, S. Pan, and C. Hwang, “De-embedding Techniques for Transmission Lines: An Exploration, Review, and Proposal,” in Proc. IEEE EMC Symposium, pp. 840-845, Aug. 2013.
- 2] N. Erickson, X. Gao, J. Fan, B. Achkir, S. Pan, “De-embedding Techniques for Transmission Lines: An Application to Measurements of On-Chip Coplanar Traces,” in Proc. IEEE EMC Symposium, pp. 660-666, Aug. 2014
