Sergey Kharkovsky (Sergiy Kharkivskiy) received the Diploma in electronics engineering from Kharkov National University of Radioelectronics, Ukraine, in 1975, and his Ph.D. and D.Sc. degrees in radiophysics from the Kharkov National University, Ukraine, and from the Institute of Radio-Physics and Electronics (IRE) of National Academy of Sciences of Ukraine, Kharkov, in 1985 and 1994, respectively.
Currently he is a Research Associate Professor in the Electrical and Computer Engineering Department at Missouri University of Science and Technology (Missouri SandT). He has been with Missouri SandT, since March 2003. Prior to joining Missouri SandT he was a Member of the Research Staff at IRE from 1975 to 1998, and a Professor in the Electrical and Electronics Engineering Department at the Cukurova University, Adana, Turkey, from 1998 to 2003. He has authored and co authored more than 120 publications in the microwave and millimeter wave physics and engineering, material characterization, imaging and nondestructive evaluation, and he has 11 USSR patents and 3 US patents in his credit. He is a Fellow of the IEEE and an Associate Editor for the IEEE Transactions on Instrumentation and Measurement since February 2007 where he is also a member of the Best Paper Award Committee. His areas of expertise are microwave and millimeter wave waveguides and resonators, reflectometry, measurements, nondestructive testing and imaging; millimeter wave oscillators; nondestructive measurements; dielectric waveguides and resonators. He is a member of the American Society of Nondestructive Testing (ASNT) where he is a member of the ASNT University Programs Award Committee.
