Skip to main content

IEEE.org
IEEE Xplore®
IEEE Standards
IEEE Spectrum
More Sites

Login
Join IEEE
Donate

Home
About

About IMS
About the I&M Society Contact Us Join IMS

Committees & Representatives
IMS Standing Committees Representatives & Liaisons

Who We Are
Officers Current Members-at-Large AdCom Members

History
Presidents Members-at-Large (by term)

Governing Documents
Constitution Bylaws Society Handbook Society Strategic Plan
Awards

Awards & Recognition Program
About Awards & Recognitions

Society Awards
Career Excellence Award Distinguished Service Award Outstanding Young Engineer Award Technical Award J. Barry Oakes Advancement Award Best Application in I&M Award

Membership Awards
Best Student Chapter Award Outstanding Chapter Award

Education Awards
Graduate Fellowship Award Faculty Course Development Award Best Dissertation Award Undergraduate Student Scholarship International Student Contest

Technical & Standards Awards
Outstanding Technical Committee Award

IEEE
IEEE Fellows Tips for IEEE Fellow Nominations IEEE Senior Members Joseph F. Keithley Award in I&M
Activities

Technical Activities
About Technical & Standards Activities Council Memberships Technical Committees Listing Technical & Standards Activity Award Standards Activities

Educational Activities
About Educational Activities Education Awards Distinguished Lecturer Program Virtual Distinguished Lecturer Webinars Video Tutorials Program Short Courses Video Library

Membership Activities
About Membership Activities Membership Benefits (Join Us) Women in I&M Student Activities Young Professionals Chapters Mentorship Program IMS EPICS in IEEE
Publications

General Information
About Publications Publications Committee Andy Chi Best Paper Award Cam Ingelin Best Paper Award I&M Society Bookshelf

Society Publications
Instrumentation & Measurement Magazine Transactions on Instrumentation and Measurement Open Journal of Instrumentation and Measurement Co-Sponsored Periodicals I&M Society Newsletter
Conferences

General Information
About Conferences Conferences Committee Organize a Conference

Society Conferences
All Events Financially Sponsored Conferences Technically Co-Sponsored Conferences

Search

Position
TC-17: Materials In Measurements Co-Chair

TC-17: Materials in Measurements Co-Chair

Current

George Giakos

Affiliation

Manhattan College

Country

USA

IEEE Region

Region 01 (Northeastern U.S.)

Email

Email

Subscribe to Our Email List

Home
Contact
Accessibility
Nondiscrimination Policy
IEEE Ethics Reporting
Terms & Disclosures
IEEE Privacy Policy
Sitemap

© Copyright 2026 IEEE – All rights reserved. A public charity, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.

This site is created, maintained, and managed by Conference Catalysts, LLC