IEEE OJIM Contest Award Winners
In July, we ran a contest for the newly launched IEEE Open Journal of Instrumentation and Measurement (OJIM). Here is the question we asked at that time:
“In OJIM’s logo, we can see the standard IEEE open access sign (the “opened lock”) that IEEE uses for all its accelerated Gold Open Access journals. In addition, the lock contains symbols that constitute something of special significance in metrology, if you look closely at the lock’s circle.
What is that “something of special significance in metrology” in the logo?”
The correct answer is the 7 SI Base Units or Quantities, as shown in the Figure.
The following winners each receive a waiver for OJIM Open Access fee, currently set at US$1,850.00, for their paper accepted in OJIM in 2021 or 2022:
- Giovanni Battista Rossi, Università degli studi di Genova
- Egidio De Benedetto, University of Naples Federico II
- Attilio Di Nisio, Polytechnic University of Bari
- Stephen A. Dyer, Kansas State University
- Leonardo Iannucci, Politecnico di Torino
- Jersson Xavier Leon Medina, Universidad Nacional de Colombia- sede Bogotá
- Muhammad Hassan ul Haq, NED University of Engineering & Technology
- Riccardo Sabbadini, Università Campus Bio-Medico di Roma
To learn more about OJIM, click here.