Editors Information Classification Scheme (EDICS)

Measurement theory
Measurement and estimation uncertainty
Measurement precision
Metrology, standards and calibration
Probabilistic methods
Statistical methods and applications
Uncertainty analysis

Absolute electrical measurements
Electrical metrology (DC and low frequency)
Electrical variable measurements
Nanotechnology
Quantum measurements

Artificial intelligence
Bayesian methods
Computational intelligence
Fuzzy logic
Genetic algorithms
Machine learning
Neural networks
Pattern recognition
Soft computing
Swarm intelligence

Automation
Condition-Based Maintenance
Design for testability
Fault diagnosis
Testing

Amplifiers
Analog-digital conversion
Circuits
Digital-analog conversion
Electronic circuits
Electronic instrumentation
FPGA
Integrated circuits
Sigma delta converters

Communications
Digital communications
Distributed measurement systems
Modulation
Network Measurements (delay, jitter, bandwidth, congestion)
Networked instruments
Remote sensing applications
Synchronization (clock, network, phase, frequency, time)
Telecommunication measurements
Wireless networks
Wireless telecommunications

CCD camera measurements and instrumentation
Image processing
Vision-based instrumentation and measurement

Imaging systems
Infrared measurements
Thermography
Tomography: Acoustic/Ultrasound
Tomography: Electrical capacitance
Tomography: Electrical impedance/resistivity
Tomography: Magnetic
Tomography: Microwave/Terahertz
Tomography: Optical/Image/Laser/X-Ray
X-ray

Dielectric measurements
Dielectric resonators
Dielectric waveguides
Eddy current measurements
Electromagnetic measurements
Insulators
Magnetic materials
Magnetic measurements
Material characterization
Nondestructive measurements
Radiation measurements
Spectroscopy

Electrochemical measurements
Fluids and flow measurement
Mechanical measurements
Mechatronics
MEMS/NEMS
Motors
Robotics

Biomedical applications
Biomedical instrumentations
Health monitoring
Medical measurements
MRI

Fiber Optics
Lasers (applications)
Lasers (devices)
Optical instrumentation
Optical measurements
Optoelectronics

Power electronics
Power generation, transmission and distribution
Power systems
Smart Grid measurements
Solar cells

Navigation and guidance
Optical radars (e.g., Lidar)
Radars

Antenna measurements
High-frequency instruments
High-frequency measurements
Low frequency measurements
Microwave instrumentation
Microwave measurements
Microwave Nondestructive testing
Microwave reflectometry
Microwave resonators
Millimeter-wave instruments
Millimeter-wave measurements
RFID

Environmental measurements
Sensing strategy and methodology
Sensor fusion
Sensor networks
Sensors and actuators
Sensors: biosensors
Sensors: chemical
Sensors: electrical/electronic
Sensors: inertial
Sensors: light/optical/optics/optoelectronic
Sensors: magnetic
Sensors: mechanical
Sensors: sound/ultrasonic
Sensors: temperature and thermal
Wireless sensors

Analog signal processing
Digital signal processing
Digital signal processor
Frequency-domain measurements
Noise measurements
Signals & systems in measurements
Time and frequency signal analysis
Time-domain measurements
Wavelet transform

Software for instrumentation and measurement
Virtual instruments and measurements

Acoustic instrumentation and measurements
Ultrasonics

Acquisition systems
Controls and control systems
Data acquisition
Embedded systems
Process control measurements
Real-time measurements
Reliability
System identification