TC-10: Waveform Generation, Measurement & Analysis
The goals of this Committee are to:
- Develop, promote and support standards for specifying and measuring waveforms, and for specifying and testing instrumentation used for waveform measurement or generation;
- Promote effective practices of waveform measurement, generation, and analysis through workshops, review papers, etc.;
- Maintain liaison with other groups, societies, and standards organizations working in the same area.
There is a global need to standardize the terms and the test and computational methods that are used to describe and/or measure the parameters that characterize and define the performance of devices that generate signals and subsequently acquire and analyze the waveforms associated with those signals. This standardization is essential for accurate, reproducible, reliable, and communicable characterization of the performance of these devices, which supports technology and product advancement, product comparison and performance tracking, and device calibration and traceability. TC-10, the Waveform Generation, Measurement, and Analysis Committee, develops documentary standards to address these needs. The TC-10 comprises an international group of electronics engineers, mathematicians, professors and physicists with representatives from national metrology laboratories, national science laboratories, component manufacturers, the test instrumentation industry, academia, and end users. The published standards developed and maintained by the TC10 include: IEEE Std 181-2011, “Standard on Transitions, Pulses, and Related Waveforms;” IEEE Std 1057-2017, “Standard for Digitizing Waveform Recorders;” IEEE Std 1241-2010, “Standard for Terminology and Test Methods for Analog-to-Digital Converters;” IEEE Std 1658-2011, “Standard for Terminology and Test Methods for Digital-to-Analog Converters;” and the IEEE Std 1696-2013, “Standard for Terminology and Test Methods for Circuit Probes;" and the IEEE Std 2414-2020 "Standard for Jitter and Phase Noise."
TC-Standards Association (SA) Site TC-10 iMeet Page
TC-10 Documents
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2024 TC-10 Annual Report
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2023 TC-10 Annual Report
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2022 TC-10 Annual Report
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2021 TC-10 Annual Report
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2020 TC-10 Annual Report
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2019 TC-10 Annual Report
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2017 TC-10 Annual Report
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2014 TC-10 Annual Report
TC-10 Useful Links
TC-10 Standards
The TC10 scope covers the science, technology, and application of electronic instrumentation and electrical measurement. TC10 is actively revising two of its standards:
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IEEE P181TM – IEEE Standard for Transitions, Pulses, and Related Waveforms (REVISION)
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IEEE P1696TM – IEEE Standard for Terminology and Test Methods for Circuit Probes (REVISION)
For your reference, the IEEE Instrumentation and Measurement Society TC10 Waveform Generation and Measurement Standards Committee has developed, published, and maintains the standards listed below:
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IEEE 181-2011TM – IEEE Standard for Transitions, Pulses, and Related Waveforms
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IEEE 1057-2017TM – IEEE Standard for Digitizing Waveform Recorders
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IEEE 1241-2023TM – IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
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IEEE 1696-2013TM – IEEE Standard for Terminology and Test Methods for Circuit Probes
Participating in the TC-10 Standards Committee
The benefit of joining the IEEE TC10 is that your membership provides you an opportunity to influence, guide, develop, and contribute to international standards that affect your industry, your research, and your procurement decisions Read more here.
If you are interested in participating in the Standards Committee, please send an email to: (Click to show email).
Similar Standards Development Organizations
The following are standards development organizations with similar interests to TC-10.
Contributing National Metrology Institutes
The following are national metrology institutes that have contributed to and continue to contribute to the development of TC10 documentary standards and also provide calibration services applicable to TC10-developed-and-maintained standards.
Related Standards
International Electrotechnical Commission (IEC)
- IEC 60469:2013, Transitions, pulses and related waveforms: Terms, definitions and algorithms
- IEC 60748-4-3:2006, Semiconductor devices – Integrated circuits - Part 4-3: Interface integrated circuits – Dynamic criteria for analogue-digital converters (ADC)
- IEC 61280-2-3:2009, Fiber optic communication subsystem test procedures - Part 2-3: Digital systems - Jitter and wander measurements
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE Std 1007-1991, Jitter for Methods and Equipment for Measuring the Transmission Characteristics of Pulse-Code Modulation (PCM) Telecommunications Circuits and Systems
- IEEE Std 1394-2008, Jitter for High-Performance Serial Bus
- IEEE Std 1521-2003(R2010), Jitter in the Standard for Measurement of Video Jitter and Wander
- IEEE Std 1596.3-1996, Jitter for Low-Voltage Differential Signals (LVDS) for Scalable Coherent Interface (SCI)
- IEEE Std 686-1997, Jitter for Radar Definitions
- IEEE Std 743-1995, Jitter in the IEEE Standard Equipment Requirements and Measurement Techniques for Analog Transmission Parameters for Telecommunications
- IEEE Std 802.3-2008, Jitter in IEEE Standard for Information technology — Telecommunications and information exchange between systems — Local and metropolitan area networks — Specific requirements. Part 3: Carrier sense multiple access with Collision Detection (CSMA/CD) Access Method and Physical Layer Specifications
International Telecommunications Union (ITU)
- ITU-R Recommendation BT.1363 (1998), Jitter Specifications and Methods for Jitter Measurements of Bit-Serial Signals Conforming to Recommendations ITU-R BT.656, ITU-R BT.799 and ITU-R BT.1120
- ITU-T G.810 (1996), SERIES G: Transmission Systems and Media Digital Transmission Systems, Digital networks - Design objectives for digital networks - Definitions and terminology for synchronization networks
Applicable Technical Manuscripts
JUMP TO:
Waveform measurement, generation, and analysis | Waveform recorder test and evaluation | Analog-to-digital conversion | Digital-to-analog conversion | Circuit probes
Waveform measurement, generation, and analysis
I. Orfanos1, I. Makos, I. Liontos, E. Skantzakis, B. Förg, D. Charalambidis, and P. Tzallas, “Attosecond pulse metrology,” APL Photonics 4, 080901 (2019).
https://doi.org/10.1063/1.5086773
Paulter NG Jr (2019) NIST Technical Note 2036, Comparison of the Measurement Uncertainties and Errors for the Waveform State Levels Estimated Using the Histogram Mode and Shorth Methods.
https://doi.org/10.6028/NIST.TN.2036
Bieler M and Paulter NG (2016) Estimation of waveform state levels and uncertainties using the histogram and shorth methods, Conference on Precision Electromagnetic Measurements, CPEM 2016, pp. 10-15.
https://doi.org/10.1109/CPEM.2016.7540806
N. G. Paulter and D. R. Larson, "Pulse metrology – Part 2," in IEEE Instrumentation & Measurement Magazine, vol. 15, no. 3, pp. 43-47, June 2012,
https://doi.org/10.1109/MIM.2012.6204873
N. G. Paulter and D. R. Larson, "Pulse metrology: Part 1," in IEEE Instrumentation & Measurement Magazine, vol. 14, no. 3, pp. 39-44, June 2011,
https://doi.org/10.1109/MIM.2011.5773536
D.R. Larson and N.G. Paulter, “Nanosecond delay with subpicosecond uncertainty,” Review of Scientific Instruments, Vol. 78, pp. 084701-1 to 084701-5, Sept. 2007
https://doi.org/10.1063/1.2760982
J. J. Blair, "Determining Frequency and Impulse Response Using Asymmetrical Pulses," in IEEE Transactions on Instrumentation and Measurement, vol. 56, no. 3, pp. 807-813, June 2007,
https://doi.org/10.1109/TIM.2007.894182
D.R. Larson and N.G. Paulter, “A measurement of propagation delay,” Metrologia, Volume 44, pp. 64 to 68, 2007
http://dx.doi.org/10.1088/0026-1394/44/1/009
D.R. Larson and N.G. Paulter, “Some effects of temperature variation on sampling oscilloscopes and pulse generators,” Metrologia, Vol. 43, pp. 121 to 128, 2006,
http://dx.doi.org/10.1088/0026-1394/43/1/017
N.G. Paulter and D.R. Larson, “The effect of tilt on waveform state levels and pulse parameters,” IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18 to 20 May 2004, pp. 1296 to 1300.
https://doi.org/10.1109/IMTC.2004.1351303
D.R. Larson, N.G. Paulter, D.I. Bergman, “Pulse parameter dependence on transition position and epoch duration,” IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18 - 20 May 2004, pp. 1291 to 1295.
https://doi.org/10.1109/IMTC.2004.1351302
N.G. Paulter and D.R. Larson, “Pulse parameter uncertainty analysis,” Metrologia, Vol. 39, 2002, pp. 143 to 155
https://doi.org/10.1088/0026-1394/39/2/4
O. M. Solomon, D. R. Larson and N. G. Paulter, "Comparison of some algorithms to estimate the low and high state level of pulses," IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188), Budapest, 2001, pp. 96-101 vol.1,
https://doi.org/10.1109/IMTC.2001.928794
N.G. Paulter, "Low-jitter trigger system for pulse calibration and intercomparison of high-speed samplers," IEEE Transactions on Instrumentation and Measurement, Vol. 47, pp. 606 to 608, June, 1998.
https://doi.org/10.1109/19.744308
N.G. Paulter, "The effect of histogram size on histogram-derived pulse parameters," IEEE Transactions on Instrumentation and Measurement, Vol. 47, pp. 609 to 612, June, 1998.
https://doi.org/10.1109/19.744309
J. J. Blair, "Error estimates for frequency responses calculated from time-domain measurements," in IEEE Transactions on Instrumentation and Measurement, vol. 47, no. 2, pp. 345-353, April 1998,
https://doi.org/10.1109/19.744173
J. P. Deyst, T. M. Souders and J. J. Blair, "Uncertainties of frequency response estimates derived from responses to uncertain step-like inputs," Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec, Brussels, Belgium, 1996, pp. 151-155 vol.1,
https://doi.org/10.1109/IMTC.1996.507366
Waveform recorder test and evaluation
J. J. Blair, "Method for eliminating aliasing in the measurement of the step response for a waveform recorder," Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510), Como, 2004, pp. 310-313 Vol.1,
https://doi.org/10.1109/IMTC.2004.1351051
J. Blair, "Sine-fitting software for IEEE Standards 1057 and 1241," IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309), Venice, 1999, pp. 1504-1506 vol.3,
https://doi.org/10.1109/IMTC.1999.776077
J. J. Blair, "A method for characterizing waveform recorder errors using the power spectral distribution," in IEEE Transactions on Instrumentation and Measurement, vol. 41, no. 5, pp. 604-610, Oct. 1992,
https://doi.org/10.1109/19.177329
J. J. Blair, "A method for characterizing waveform recorder errors using the power spectral distribution," in IEEE Transactions on Instrumentation and Measurement, vol. 41, no. 5, pp. 604-610, Oct. 1992,
https://doi.org/10.1109/19.177329
T. M. Souders, D. R. Flach and J. J. Blair, "Step and frequency response testing of waveform recorders," 7th IEEE Conference on Instrumentation and Measurement Technology, San Jose, CA, USA, 1990, pp. 214-220,
https://doi.org/10.1109/IMTC.1990.66001
“Analog-Digital Converters: What do you need to know to understand this topic?,”
http://www.onmyphd.com/?p=analog.digital.converter
M. Gudino, “Engineering Resources: Basics of Analog-to-Digital Converters,” 17 Apr 2018,
https://www.arrow.com/en/research-and-events/articles/engineering-resource-basics-of-analog-to-digital-converters
P. Sagsveen, “ADC/DAC Tutorial,” Digi-Key Electronics, 2017-09-13,
https://www.digikey.com/en/articles/adc-dac-tutorial.
B. Herd, “Analog to digital converter (ADC): A true understanding,” 5 May 2016,
https://hackaday.com/2016/05/05/analog-to-digital-conversion/
J. J. Blair, "Selecting Test Frequencies for Two-Tone Phase-Plane Analysis of ADCs: Part II," in IEEE Transactions on Instrumentation and Measurement, vol. 56, no. 4, pp. 1171-1175, Aug. 2007, doi: 10.1109/TIM.2007.899910.
https://doi.org/10.1109/TIM.2007.899910
T.E. Linnenbrink; J. Blair; S. Rapuano; P. Daponte; E. Balestrieri; L. De Vito; S. Max; S.J. Tilden, "ADC testing - Part 7 in a series of tutorials in Instrumentation and Measurements," in IEEE Instrumentation & Measurement Magazine, vol. 9, no. 2, pp. 37-47, Arpil 2006,
https://doi.org/10.1109/MIM.2006.1634987
D. A. Rauth and V. T. Randal, "Analog-to-digital conversion. part 5," IEEE Instrumentation & Measurement Magazine, vol. 8, no. 4, pp. 44-54, Oct. 2005,
https://doi.org/10.1109/MIM.2005.1518622.
S. Rapuano; P. Daponte; E. Balestrieri; L. De Vito; S.J. Tilden; S. Max; J. Blair, "ADC parameters and characteristics," in IEEE Instrumentation & Measurement Magazine, vol. 8, no. 5, pp. 44-54, Dec. 2005,
https://doi.org/10.1109/MIM.2005.1578617
I. Kollar and J. J. Blair, "Improved determination of the best fitting sine wave in ADC testing," in IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 5, pp. 1978-1983, Oct. 2005,
https://doi.org/10.1109/TIM.2005.855082
K. Fowler, "Part 7: analog-to-digital conversion in real-time systems," in IEEE Instrumentation & Measurement Magazine, vol. 6, no. 3, pp. 58-64, Sept. 2003,
https://doi.org/10.1109/MIM.2003.1238355.
J. J. Blair, "Selecting test frequencies for two-tone phase plane analysis of ADCs," in IEEE Transactions on Instrumentation and Measurement, vol. 51, no. 5, pp. 976-979, Oct. 2002,
https://doi.org/10.1109/TIM.2002.807805
J. Blair, "Selecting test frequencies for two-tone phase plane analysis of ADC's," IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188), Budapest, 2001, pp. 1843-1846 vol.3,
https://doi.org/10.1109/IMTC.2001.929518
J. Blair, "Histogram measurement of ADC nonlinearities using sine waves," in IEEE Transactions on Instrumentation and Measurement, vol. 43, no. 3, pp. 373-383, June 1994,
https://doi.org/10.1109/19.293454
“Introduction to Digital-Analog Conversion, Chapter 13 - Digital-Analog Conversion,”
https://www.allaboutcircuits.com/textbook/digital/chpt-13/digital-analog-conversion/
P. Sagsveen, “ADC/DAC Tutorial,” Digi-Key Electronics, 2017-09-13,
https://www.digikey.com/en/articles/adc-dac-tutorial
“Passive Probe Ground Lead Effects,” Teledyne Lecory, 2013,
https://cdn.teledynelecroy.com/files/appnotes/passive_probe_ground_lead_effects.pdf
“Eight Hints for Better Scope Probing, Application Note,” Keysight Technologies,
https://prc.keysight.com/Content/PDF_Files/5989-7894EN.pdf
“Choosing the Best Passive and Active Oscilloscope Probes for Your Tasks, Application Note,” Keysight Technologies,
https://prc.keysight.com/Content/PDF_Files/5990-8576EN.PDF
“The Truth About the Fidelity of High-Bandwidth Voltage Probes, Application Note,” Keysight Technologies,
https://prc.keysight.com/Content/PDF_Files/5988-6515EN.pdf
H. Johnson “Probing High-Speed Digital Designs,” first printed in Electronic Design, March, 1997,
http://www.sigcon.com/Pubs/straight/probes.htm
A. Frost, D. Whiteman, and J. Tsai, “Are you measuring your circuit or your scope probe?,” EDN Magazine, 22 July 1999, pp. 53 to 58,
https://www.edn.com/wp-content/uploads/1999/07/7.22.19_DF.pdf
N. Davis, “An Introduction to Oscilloscope Probes,” All About Circuits, June 29, 2017,
https://www.allaboutcircuits.com/technical-articles/an-introduction-to-oscilloscope-probes/
“Oscilloscope probes - an overview or tutorial about the various types of oscilloscope probe that are available for use with oscilloscopes,” Electronics Notes,
https://www.electronics-notes.com/articles/test-methods/oscilloscope/scope-probes.php
“Oscilloscope Probe Specifications & Parameters,” Electronics Notes,
https://www.electronics-notes.com/articles/test-methods/oscilloscope/scope-probe-specifications.php
D. Maliniak, “Oscilloscope Probes Influence Measurements,” Electronic Design, 6 May 2014,
https://www.electronicdesign.com/technologies/test-measurement/article/21799660/oscilloscope-probes-influence-measurements
TC-10 Superseded IEEE Standards
IEEE 181, IEEE Standard on Transitions, Pulses, and Related Waveforms
- IEEE 181-2011
- IEEE 181-2003
- In 2003, the content of the IEEE Std 181 and IEEE Std 194 were merged.
1. IEEE 181, IEEE Standard on Pulse Measurement and Analysis by Objective Techniques
2. IEEE 194, IEEE Standard Pulse Terms and Definitions
- IEEE 194-1977
- IRE Standards on Pulses: Definitions of Terms, Part I, 1951*
- IRE Standards on Pulses: Definitions of Terms, Part II, 1952*
IEEE Std 1057, IEEE Standard for Digitizing Waveform Recorders
IEEE Std 1241 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
*Two separate organizations, the American Institute of Electrical Engineers (AIEE) and the Institute of Radio Engineers (IRE) joined in 1963 to form the IEEE.