TC-34: Nanotechnology in Instrumentation and Measurement
Scope
The goals of this Committee are to establish, develop, promote and support cooperation among researchers, industry & academia involved in different fields of nanotechnology instrumentation and measurement.
Topics of these cooperations include:
- Sensors for the measurement of nanotechnology properties. Many new or improved sensors are continuously developed that allow new or more accurate measurements to be performed.
- Promote the use of a variety of imaging techniques and methodologies in the fields of instrumentation, measurement, and test, such as scanning probe microscopy, electron microscopy and more.
- Instrument and procedure characterisation. Nanotechnology instruments and related data processing depend deeply upon the training and background of the researcher who uses them.
- Promote the exchange of technical advances among experimentalists and theorists working in different areas of the field.
- Maintain a list of research laboratory capabilities and researcher contact information for nanomaterial and nanosensor characterization.
- Promote the utilization of such technologies in real applications.
- Address the increasing demand for performance and functionality in nanomaterials and nanotechnology.
- Address the increasing need for common terminology throughout nanotechnology.
- Instrument interoperability and interconnection. Most analyses are obtained by combining test results generated by different instruments. The 'data fusion' is often performed by the scientist or engineer only at the end of the measurement process, but a standard format for raw data generated by the different instruments could greatly improve quality and performance. Standards may need to be developed to promote these ends.
- Attract interest of the scientific, academic and industrial communities in the exploration of advanced instrumentation and measurement methods in nanotechnology.
- Capture and disseminate technical information relative to the field via workshops, conferences, and formal papers.
- Maintain liaison with other groups, societies, and organizations working in the same or related fields while promoting the instrumentation and measurement aspects at nanotechnology conferences and in international standards.
This is a young committee: we need your help to have it growing and making it useful for the scientific community of both nanotech instrument and measurement researchers!
TC-34: Nanotechnology in Instrumentation and Measurement
TC-34 Documents
Up
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2021 TC-34 Annual Report
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2020 TC-34 Annual Report
TC-34 Meetings
Quick Links
Meetings
- May 14th, 2014
face-to-face meeting, Montevideo, Uruguay (IEEE I2MTC) - May 14th, 2015
face-to-face meeting, Pisa, Italy (IEEE I2MTC) - June 24th, 2015
face-to-face meeting, Lecce, Italy (Nanofim 2015) - July 27th, 2015
IEEE Nanotechnology AdCom, Rome - May 12-14, 2016
IEEE MeMea 2016 Special Session on Nanotechnology for Biomedical Instrumentation and Measurement
Organizer: A. Lay-Ekuakille - May 23-26, 2016
IEEE I2MTC 2016 Special Session on “Nanotechnology applications in Instrumentation and Measurement”
Organizers: A. Lay-Ekuakille, O. Kanoun - September 9th, 2016
face-to-face meeting, Chemnitz, Germany (Nanofim 2016) - November 16th, 2017
face-to-face meeting, Greater Norda, India (Nanofim 2017) - November 7th, 2018
hybrid meeting, Mexico City, Mexico (Nanofim 2018) - October 30th, 2019
face-to-face meeting, Sfax, Tunisia (Nanofim 2019) - November 24th, 2021
virtual meeting, Opole, Poland (Nanofim 2021) - May 24th, 2021
Webinar on Medical Proximity Services Organized by the University of Salento, and the Government of Apulia Region (Lecce, Italy),
Sponsorship along with IEEE Sensors Chapter, Italy, Chair: Aimé Lay-Ekuakille - August 15th, 2022
Seminar on Metrics for Measurement and Instrumentation organized by the ISPT University (Kinshasa, DR Congo), - September 14th, 2022
hybrid meeting - December 24-26th, 2022
Open session for the approval of new members