Skip to main content
IEEE.org
IEEE
Xplore®
IEEE Standards
IEEE Spectrum
More Sites
Login
Join IEEE
Donate
Home
About
About IMS
About the I&M Society
Contact Us
Join IMS
Committees & Representatives
IMS Standing Committees
Representatives & Liaisons
Who We Are
Officers
Current Members-at-Large
AdCom Members
History
Presidents
Members-at-Large (by term)
Governing Documents
Constitution
Bylaws
Society Handbook
Society Strategic Plan
Awards
Awards & Recognition Program
About Awards & Recognitions
Society Awards
Career Excellence Award
Distinguished Service Award
Outstanding Young Engineer Award
Technical Award
J. Barry Oakes Advancement Award
Best Application in I&M Award
Membership Awards
Best Student Chapter Award
Outstanding Chapter Award
Education Awards
Graduate Fellowship Award
Faculty Course Development Award
Best Dissertation Award
Undergraduate Student Scholarship
International Student Contest
Technical & Standards Awards
Outstanding Technical Committee Award
IEEE
IEEE Fellows
Tips for IEEE Fellow Nominations
IEEE Senior Members
Joseph F. Keithley Award in I&M
Activities
Technical Activities
About Technical & Standards Activities
Council Memberships
Technical Committees Listing
Technical & Standards Activity Award
Standards Activities
Educational Activities
About Educational Activities
Education Awards
Distinguished Lecturer Program
Virtual Distinguished Lecturer Webinars
Video Tutorials Program
Short Courses
Video Library
Membership Activities
About Membership Activities
Membership Benefits (Join Us)
Women in I&M
Student Activities
Young Professionals
Chapters
Mentorship Program
IMS EPICS in IEEE
Publications
General Information
About Publications
Publications Committee
Andy Chi Best Paper Award
Cam Ingelin Best Paper Award
I&M Society Bookshelf
Society Publications
Instrumentation & Measurement Magazine
Transactions on Instrumentation and Measurement
Open Journal of Instrumentation and Measurement
Co-Sponsored Periodicals
I&M Society Newsletter
Conferences
General Information
About Conferences
Conferences Committee
Organize a Conference
Society Conferences
All Events
Financially Sponsored Conferences
Technically Co-Sponsored Conferences
Search
Search
Contact
Gerd Dobman
Gerd Dobman
Affiliation
Fraunhofer Institute for Nondestructive Testing IZFP
Email
Email
Memberships
IMS
Biography
IEEE IMS Position History:
Present
Members
(TC-01: Nondestructive Evaluation and Industrial Inspection (NDE&II))
Outdated or incorrect information? Please click here to update us with the correct information.
