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Career Excellence Award

$5,000, Plaque, and travel allowance of up to $1,000 is granted on a need basis for the recipient to attend the awards ceremony.
Funded by the IEEE Instrumentation and Measurement Society.
Nomination Deadline: 
August 1, 2020
Awarded annually at the discretion of the I&M Society Awards Committee at the following year’s I2MTC awards ceremony.
Must be a member of IEEE and the Instrumentation and Measurement Society at the time of nomination and presentation. Voting members of the Society Standing Awards Committee are not eligible. Nominees must exhibit actions that reflect positively on and enhance the reputation of the I&M Society. Eligibility and Selection process shall comply with procedures and regulation established in IEEE and Society/Council governing documents, particularly with IEEE Policy 4.4. on Awards Limitations ( Previous award winners are not eligible.
Basis for Judgment: 
Recognizes a lifetime career of meritorious achievement and outstanding technical contributions by an individual in the field of instrumentation and measurement. The nomination must clearly indicate the achievements that define the excellence of the candidate and must reference/provide relevant documentation that is in/or not in/ the public domain. At least 2, but no more than 4, endorsements must be provided by individuals with close knowledge of a candidate’s activities that led to the achievements cited.

Note: In addition to the Nominator’s letter, at least one, but no more than three support letters may be submitted.

Description of Award: To recognize a career of meritorious achievement and outstanding technical contribution by an individual in the field of instrumentation and measurement.


Award Recipients

    Kang Lee Headshot Photo
    For serving the profession technically through his research on Clock Synchronization and leading standardization efforts to disseminate the knowledge; and for serving the I&M society through organizing and co-chairing conferences and through his work on TC-9.

    Pasquale Daponte Headshot Photo
    For a lifelong career and outstanding leadership in research and education on instrumentation and measurement, and a passionate and continuous service, international in scope, to the profession.

    Nelson photo
    For pioneering research in the measurement and study of wide-frequency-range dielectric properties of agricultural materials, for exploring their engineering and scientific applications, and for documenting these properties and findings in reference publications.

    For significant contributions in instrumentation & measurement for underground nuclear testing, which helped the USA win the Cold War, and for monumental technical and administrative contributions to IEEE standards on waveform recorders, analog-to-digital

    For half a century of leadership, advancing state-of-the-art test and measurement instruments

    Massimo D'Apuzzo Photo
    For lifelong activity and outstanding achievement in pioneering the use of microcontrollers in electrical measurements.

    Solomon Max
    For pioneering automatic test equipment design, CODEC & DSP test methodology and monumental improvements in signal generation and digitization hardware & calibration

    Headshot Photo
    “For decades of advancements in measurement science and its dissemination.”

    Asad Madni Headshot Photo
    For an extraordinary career of enlightened leadership in and pioneering contributions to the development and commercialization of intelligent sensors, systems and instrumentation.

    Stephen Dyer Headshot Photo
    For a career dedicated to education in science and engineering; for research contributions in instrumentation and Hadamard-transform spectrometry; and for outstanding contributions to the I&M Society, including service as Editor-in-Chief of Transactions