The IEEE J. Barry Oakes Advancement Award will be used to provide a question and answer lecture during the annual I2MTC or AUTOTEST. Exceptionally, and upon motivated request by the recipient, the presentation will be given to another event fully sponsored by the IEEE Instrumentation and Measurement Society.
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J. Barry Oakes Advancement Award
$3,000 USD which may be used to attend a technical workshop or I2MTC or AUTOTESTCON; Registration at I2MTC or AUTOTESTCON for year in which lecture is presented; Plaque designating the individual as the recipient of the IEEE J. Barry Oakes Advancement Award.
This award will be funded by the J. Barry Oakes Fund managed by the IEEE Foundation.
*DEADLINE EXTENSION* - 1 October 2017
Electronic Application Package must include:
-Nominating letter from nominator outlining qualifications of nominee
-CV of the nominee, with clear indication of the date of birth
-350-word biographical summary of the candidate
-A statement identifying at which conference (I2MTC or AUTOTEST) the nominee would prefer to present, and explain the benefits of nominee's attendance at the conference
-Description of additional support provided to nominee by employer
-Title and abstract of presentation
The award will be presented at venue of the presentation. Visibility will be given to the presentation, in accordance with the Technical Program of the conference. A 35-minute lecture (with additional 10 minutes for questions and answers) on current instrumentation and measurement topics.
35 years of age or younger at the time of the nomination. Other qualifications of the nominee include one or more of the following: Nominee actively engaged in engineering work in the field of IMS; Nominee may hold a position in academia, government, or industry.
Basis for Judgement:
Qualifications include one or more of the following: Demonstrated contributions to IMS science and engineering; potential leadership/project management skills; potential to serve as role model for other engineers. Nominees must exhibit actions that reflect positively on and enhance the reputation of the I&M Society
“For fundamental contributions to the frequency domain measurement and identification of time-variant stystem.”
For contributions to the development of real-time millimeter wave imaging systems for nondestructive evaluation applications
"A New Approach to Uncertainty Evaluation in Complex Measurement Systems"