Nominees must exhibit actions that reflect positively on and enhance the reputation of the I&M Society
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Outstanding Young Engineer Award
The Award consists of $2000 and a plaque. Also up to $1,000 will be paid to the recipient for transportation to the place of the presentation.
This award is funded by the IEEE I&M Society.
September 1 (extended from August 1)
The award will be presented each year at the IEEE I2MTC Conference.
The nominee must not have reached their 39th birthday and must be an I&M member at the time of nomination.
Basis for Judgement:
The I&M Outstanding Young Engineer Award recognizes an outstanding young I&M member who has distinguished him/herself through achievements, which are technical, of exemplary service to the I&M Society, or a combination of both early in their career. The nominee must not have reached their 39th birthday and must be an I&M member at the time of nomination.
For outstanding contributions to the development of microwave/millimeter wave instruments and sensors for the industrial, scientific, and medical applications.
“For outstanding contributions in the development of microwave technology as a nondestructive evaluation method, and applications of advanced ultrasound, digital radiography and other methods for the space program.”
For his contribution to the advancement of instrumentation and measurement in the field of reliability analysis.
For leadership and innovation in industry-focused engineering education and research in electronic test technology
For outstanding contributions to real-time microwave imaging and nondestructive testing systems development.
For contribution to the development of dual-differential embedded modulated scatterer technique for microwave materials characterization
“For innovative application of statistical techniques and signal analysis for biomedical applications”
For advancement in stochastic signal processing for real-time data acquisition and surveillance measurements.
For outstanding contributions in applying uncertainty concepts to complex measurement processes that involve significant human factors.
In recognition of contributions to the dynamic metrological characterization of ADCs.