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Outstanding Young Engineer Award

$2,000, Certificate and Plaque.
This award is funded by the IEEE Instrumentation and Measurement Society.
Nomination Deadline: 
August 1, 2020
The award will be presented each year at the IEEE I2MTC Conference.
Nominee must be no more than 38 years of age (must not have reached the 39th birthday) and must be an I&M member at time of nomination and presentation. Nominator must certify the eligibility of the nominee at the time of nomination. Members of the Society Standing Awards Committee and ratifying Society Administrative Committee are not eligible. Nominees must exhibit actions that reflect positively on and enhance the reputation of the I&M Society.
Basis for Judgment: 
The nomination must clearly indicate the achievements that define the excellence of the candidate and must reference/provide relevant documentation that is in/or not in/ the public domain. At least 3, but no more than 5 endorsements must be provided by individuals with close knowledge of a candidate’s activities that led to the achievements cited. Selection will be made by members of the Society Standing Awards Committee appointed by the President of the Society and based on assessment of value of contributions and achievements.

To recognize an outstanding young I&M member who has distinguished himself/herself through achievement(s), which may be technical (within the I&M field of interest), may be exemplary service to the I&M Society, or may be a combination of both. What distinguishes this award from other I&M achievement-based awards is that by its title, this award’s focus is on a person, not an achievement, and the Society implicitly recognizes the person who was responsible for the success of the cited achievement(s) during his/her early career.

Nominate for the Outstanding Young Engineer Award

Award Recipients

    For outstanding contributions in the development of FPGA-based digital systems and digital signal processing techniques for industrial and scientific applications in the field of electric rotating machinery.

    Mohamed Abou-Khousa Photo
    For outstanding contributions to the development of microwave/millimeter wave instruments and sensors for the industrial, scientific, and medical applications.

    Case photo
    “For outstanding contributions in the development of microwave technology as a nondestructive evaluation method, and applications of advanced ultrasound, digital radiography and other methods for the space program.”

    Lorenzo Ciani
    For his contribution to the advancement of instrumentation and measurement in the field of reliability analysis.

    For leadership and innovation in industry-focused engineering education and research in electronic test technology

    Mohammad Tayeb Ghasr Photo
    For outstanding contributions to real-time microwave imaging and nondestructive testing systems development.

    For contribution to the development of dual-differential embedded modulated scatterer technique for microwave materials characterization

    Kurt Barbé
    “For innovative application of statistical techniques and signal analysis for biomedical applications”

    Yan Zhai Headshot Photo
    For advancement in stochastic signal processing for real-time data acquisition and surveillance measurements.

    Jenny Wirandi Headshot Photo
    For outstanding contributions in applying uncertainty concepts to complex measurement processes that involve significant human factors.