Juan Manuel Ramirez Cortés was born in Puebla, Mexico. He received the B.Sc. degree from the National Politechnique Institute, Mexico, the M.Sc. degree from the National Institute of Astrophysics, Optics, and Electronics (INAOE), and the Ph.D. degree from Texas Tech University, all in electrical engineering. Since 2007 he is at the National Institute of Astrophysics, Optics, and Electronics, Mexico, with a current appointment as titular researcher “C”. He has served at INAOE in administrative positions as Academic Representative, Coordinator of the Electronics Department (2015-2016), and Research Director (2016-2017). He is currently member of the National Research System (SNI), level 2. From 1992 to 2007 he was with Universidad de las Americas-Puebla, Mexico, in several academic and administrative positions: faculty member, Graduate advisor, Chair of the Electrical Engineering Department, Dean of the Engineering School, and University Academic Secretary. From 2002 to 2004 he was president of the National Association of Engineering Schools (ANFEI-MEXICO), and president of the Iberoamerican Association of Academic Engineering Institutions (ASIBEI). In 2006 he received an honorary appointment from Texas Tech University as Academy Member of the Electrical and Computing Engineering Department. He is a senior member of IEEE (Institute of Electrical and Electronic Engineering), past president of IEEE Puebla Section, and founder Chair of the IEEE I&MS Puebla Chapter. IIn the last years he has been member of the IEEE Instrumentation and Measurement Society Administrative Committee in several positions: Treasurer, Finance VP, President, and current Jr. Past-President. His scientific production to date consists of 56 refereed papers in scientific journals, 10 book chapters, and 150 papers in-extenso in proceedings of international conferences. He has been reviewer in several conferences and research journals, and project evaluator as RCEA member for CONACYT, Mexico. His research areas include signal and image processing, pattern recognition, neural networks, computer vision, instrumentation and sensors.
