2022 IMS Society Award Recipients

The 2022 IEEE Instrumentation & Measurement Society (IMS) Society Award Recipients have been announced! Please join us in congratulating this year's recipients on their outstanding achievements.

The 2022 IMS Society Award Recipients will be recognized at the IEEE I2MTC 2023 awards ceremony. IEEE I2MTC 2023 will be held in Kuala Lumpur, Malaysia, on 22-25 May 2023. The final date and time of the awards ceremony will be announced in early 2023. 

The call for 2023 IMS Society Award Nominations will open on 1 April 2023. To learn more about Society Awards, please visit the IMS Society Award Overview Page

Recipients

Tuan Guo - 2022 recipient of IEEE Instrumentation & Measurement Society Best Application in I&M Award

Date Awarded:

Tuan Guo

Jinan University
China
Citation:
For outstanding contributions to energy storage monitoring using optical fiber sensing technologies.

Ruqiang Yan - 2022 recipient of IEEE Instrumentation and Measurement Society Distinguished Service Award

Date Awarded:

Ruqiang Yan

Xi'an Jiaotong University
China
Citation:
For outstanding service to the I&M society, and significant contribution to revitalizing the Technical and Standards Activities Committee of the society.

Xingwu Zhang - 2022 recipient of IEEE Instrumentation and Measurement Society Outstanding Young Engineer Award

Date Awarded:

Xingwu Zhang

Xi’an Jiaotong University
China
Citation:
For outstanding contributions to health monitoring and active vibration control for industrial applications in the field of mechanical equipment.

Olfa Kanoun - 2022 recipient of IEEE Instrumentation and Measurement Society Technical Award

Date Awarded:

Olfa Kanoun

Chemnitz University of Technology
Germany
Citation:
For pioneering the evolution of impedance spectroscopy from laboratory scale to field sensors.

Shibin Wang - 2022 recipient of IEEE J. Barry Oakes Advancement Award

Date Awarded:

Shibin Wang

Xi'an Jiaotong University
China
Citation:
For contributions to the advancement of signal processing methods for machine fault diagnosis.