IEEE Instrumentation and Measurement Society Outstanding Young Engineer Award | IEEE Instrumentation & Measurement Society

To recognize an outstanding young I&M member who has distinguished himself/herself through achievement(s), which may be technical (within the I&M filed of interest), may be exemplary service to the I&M Society, or may be a combination of both. What distinguishes this award from other I&M achievement-based awards is that by its title, this award’s focus is on a person, not an achievement, and the Society implicitly recognizes the person who was responsible for the success of the cited achievement(s) during his/her early career.

Prize:

$2,000, Plaque, and travel allowance of up to $1,000 is granted on a need basis for the recipient to attend the awards ceremony.

Funding:

Funded by the IEEE Instrumentation and Measurement Society.

Presentation:

Awarded annually at the discretion of the I&M Society Awards Committee at the following year’s I2MTC awards ceremony.

Basis for Judging:

Recognizes an outstanding young I&M member who has distinguished him/herself through achievements, which are technical, of exemplary service to the I&M Society, or a combination of both, early in their career. The nomination must clearly indicate the achievements that define the excellence of the candidate and must reference/provide relevant documentation that is in/or not in/ the public domain. At least 2, but no more than 4, endorsements must be provided by individuals with close knowledge of a candidate’s activities that led to the achievements cited.

Eligibility:

Nominee must be no more than 38 years of age (must not have reached the 39th birthday). Must be a member of IEEE and the Instrumentation and Measurement Society at the time of nomination and presentation. Nominator must certify the eligibility of the nominee at the time of nomination. Voting members of the Society Standing Awards Committee are not eligible. Nominees must exhibit actions that reflect positively on and enhance the reputation of the I&M Society. Eligibility and Selection process shall comply with procedures and regulation established in IEEE and Society/Council governing documents, particularly with IEEE Policy 4.4. on Awards Limitations (https://www.ieee.org/content/dam/ieee-org/ieee/web/org/ieee-policies.pdf). Previous award winners are not eligible.

Nomination Details:

Nomination Deadline: August 1

Note: In addition to the Nominator’s letter, at least one, but no more than three support letters may be submitted.

Nomination Form:

Nominate for this Award

Recipients

2020

Carlo Trigona

For his outstanding contribution to the advancement of I&M concept in sensors and transducers for energy harvesting.

2019

Datong Liu

For intelligent system diagnostic, prognostic, and health management.

2018

José de Jesús Rangel-Magdaleno

For outstanding contributions in the development of FPGA-based digital systems and digital signal processing techniques for industrial and scientific applications in the field of electric rotating machinery.

2017

Mohamed Abou-Khousa

For outstanding contributions to the development of microwave/millimeter wave instruments and sensors for the industrial, scientific, and medical applications.

2016

Joseph Toby Case

For outstanding contributions in the development of microwave technology as a nondestructive evaluation method, and applications of advanced ultrasound, digital radiography and other methods for the space program.

2015

Lorenzo Ciani

Biography

Lorenzo Ciani (S’08–M’10-SM'16) received the M.S. degree in electronic engineering and the Ph.D. degree in Industrial and Reliability Engineering from the University of Florence, Italy, in 2005 and 2009, respectively. He is currently a Post-Doctoral Research Fellow with the Department of Information Engineering, University of Florence. From June, 2012 he is a TÜV Rheinland Industrie Service GmbH – Functional Safety Engineer – ID 5062/12. He is a Teaching assistant for “Reliability and Quality control” and “Diagnostic and systems’ safety” course

Lorenzo Ciani is active also in the field of technical publications. It has been a Guest Editor for Elsevier “Measurement” and Section Editor for “ACTA Imeko” journal. He is currently reviewer for IEEE “Transactions on Instrumentation & Measurement”, Elsevier “Measurement”, Elsevier “Computer Standard & Interface” and Elsevier “Microelectronics Reliability” journal

He is technical program committee member of the IEEE International Instrumentation and Measurement Technology Conference ESREF European Symposium on Reliability of Electron Devices, Failure Physics and Analysis IMEKO TC10 Workshop. He has been selected as I&M Society President Appointee for IEEE IMS Graduate Fellowship Award Committee 2017-2018

His current research interests include system reliability, availability, maintainability and safety, reliability evaluation test and analysis for electronic systems and devices, fault detection and diagnosis, and electrical and electronic instrumentation and measurement.

Affiliation(s)

University of Florence

For his contribution to the advancement of instrumentation and measurement in the field of reliability analysis.

2014

Melanie Ooi

Biography

Melanie Ooi is an emerging researcher and engineering specialist in Electrical and Electronic Engineering as well as Computer Engineering and Computational Intelligence. She is currently an Associate Professor at The University of Waikato, New Zealand. While working in close collaboration with several leading multinational electronics companies, she has developed new testing techniques and test data processing methodologies that have been adopted by the industry partners. In the recent years she has also successfully researched on new measurement uncertainty evaluation approaches and frameworks with application to a multitude of science and technology areas (medical research, structural design, mechanical systems modelling, etc.). Her research competence and capability are evident from the extensive and fast growing list of publications, research grants and projects, as well as successfully supervised postgraduate students.

In addition, Associate Professor Ooi was particularly successful in the area of undergraduate and postgraduate education. She introduced several innovations and a well-structured education program enhancing key professional skills and thus increasing work-readiness and employability of engineering graduates that were successfully adopted and implemented by Monash University and RMIT University in their Southeast Asian campuses. They have been strongly supported by multinational electronics companies such as Intel, Freescale Semiconductor and National Instruments.

Her high professional achievements have been acknowledged by several prestigious awards including the Outstanding Young Engineer Award of the Year 2014 from the IEEE Instrumentation and Measurement Society, 2014 Excellence Award from the International Education Association of Australia, 2011 Citation for Outstanding Contributions to Student Learning from the Australian Learning and Teaching Council to mention a few.

She is Senior Member of the IEEE, Member of the IEEE Instrumentation & Measurement Society (I&MS); I&M AdCom (2019-2022)|| Young Professional Program Representative (2018)|| Distinguished Lecturer (2016 - December 2017), Distinguished Lecturer and Secretary of the Technical Committee on Fault Tolerant Measurement Systems (TC-32) of the IEEE I&MS. She is also Member of the Institution of Engineering and Technology, and UK Chartered Engineer.

Affiliation(s)

The University of Waikato

New Zealand

For leadership and innovation in industry-focused engineering education and research in electronic test technology.

2013

Mohammad Tayeb Ghasr

For outstanding contributions to real-time microwave imaging and nondestructive testing systems development.

2012

Kristen Donnell

Biography

Kristen M. Donnell (S’07-M’11-SM’12) received her B.S.E.E. degree in May 2001 from Colorado State University, her M.S.E.E degree in December 2003 from the University of Missouri-Rolla, and her Ph.D. degree in Electrical Engineering at Missouri University of Science and Technology (Missouri S&T) in December 2010. Her Ph.D. research was conducted at the Applied Microwave Nondestructive Testing Laboratory (amntl). She is currently an Assistant Professor in the Department of Electrical and Computer Engineering at Missouri S&T, and a member of the research team at the amntl. Her current research interests include modulated antennas/scatterers, materials characterization, frequency selective surfaces, microwave and millimeter wave imaging, and hybrid nondestructive testing methods. Prior to starting her Ph.D. work, Kristen was employed by Raytheon Company, Tewksbury, MA, from 2003 to 2006 as a Systems Engineer and Electrical Engineer.

Dr. Donnell is a Senior Member of IEEE, and is also involved with the IEEE Instrumentation and Measurement (I&M) Society, where she served as an appointed member of the AdCom from 2007-2011 and is currently serving her second term as an at-large AdCom member. She served as the Chapter Chair Liaison from 2010-2012, the Vice President of the Membership Development Committee in 2013-2014, and has been the Distinguished Lecturer Program Chair since 2012. She has also been involved with the Faculty Course Development and Graduate Fellowship Awards. She also developed the annual Chapter Chair Summit that takes place each year at the I&M Society’s flagship conference, the International Instrumentation and Measurement Technology Conference, and recently developed the Chapter Support Program and serves as the Chapter Advisor to the Puebla Section Chapter.

She is the recipient of the IEEE Instrumentation and Measurement Society 2012 Outstanding Young Engineer Award, the Missouri University of Science and Technology Outstanding Teaching Award for the 2011-2012 academic year, and the 2014 Faculty Excellence in Teaching award. During her graduate studies, she was the recipient of the ASNT Fellowship Award for the 2002-2003 and 2006-2007 academic years, the Missouri S&T Chancellors Fellowship for 2006-2009, and the Missouri S&T University Transportation Center Graduate Fellowship for 2006.

Affiliation(s)

Missouri University of Science & Technology

United States

For contribution to the development of dual-differential embedded modulated scatterer technique for microwave materials characterization.

2011

Kurt Barbé

Biography

Kurt Barbé (S’05-M’09-SM’16) received the Master degree in Mathematics and the PhD degree in engineering from the Vrije Universiteit Brussel (VUB), Brussels, Belgium, in 2005 and 2009 respectively. Presently, he is a professor at the VUB at the faculty of Medicine. He is furthermore a co-founder of the research group Digital Mathematics (DIMA) holding a strong expertise in applied mathematics for engineering sciences and beyond. At VUB, he is the founder of the interfaculty centre for data-processing and statistics providing statistical and methodological support to the university community at large. Dr. Barbé is a former research fellow of the Flemish Research Foundation (FWO) and VUB-coordinator of FLAMES – the Flemish inter-university training network on research methodology and statistics. His current research interest is in the field of numerical methods and computational statistics applied to biomedicine.

Dr. Barbé has served as an Associate Editor since 2010 and Associate Editor in Chief in 2018-2019 for the IEEE Transactions on Instrumentation and Measurement. Since 2017 he has served as secretary of the royal Belgian statistical society. Finally, since 2019 he has joined the editorial board for the journal Fractal and Fractional as well as Sensors. He was a recipient of the Outstanding Young Engineer Award from the IEEE Instrumentation and Measurement Society in 2011 and the Andi Chi Best Paper Award of the IEEE Transactions on Instrumentation and Measurement in 2013. Two PhD students received the IEEE Instrumentation and Measurement Graduate Fellowship award under his supervision in 2012 and 2017.

Affiliation(s)

Vrije Universiteit Brussel

Belgium

For innovative application of statistical techniques and signal analysis for biomedical applications.