Ruqiang Yan

Ruqiang Yan Headshot

Ruqiang Yan


Ruqiang Yan received the M.S. degree in precision instrument and machinery from the University of Science and Technology of China, Hefei, China, in 2002, and the Ph.D. degree in mechanical engineering from the University of Massachusetts at Amherst, Amherst, MA, USA, in 2007.

He was a Guest Researcher at the National Institute of Standards and Technology (NIST) in 2006-2008 and a Professor with the School of Instrument Science and Engineering, Southeast University, Nanjing, China from 2019 to 2018. He joined the School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, China, in 2018. His research interests include energy-efficient sensing, data analytics, and artificial intelligence for the condition monitoring, fault diagnosis and prognosis of large-scale, complex, dynamical systems.

Dr. Yan is a Fellow of IEEE (2022) and ASME (2019). His honors and awards include the IEEE Instrumentation and Measurement Society Distinguished Service Award in 2022, and Technical Award in 2019, and multiple best paper awards. Dr. Yan is the Editor-in-Chief of the IEEE Transactions on Instrumentation and Measurement, and Editorial Board Member of several other journals.

Position(s) & Affiliation(s)

Xi'an Jiaotong University