The Fourth Industrial Revolution represents a fundamental change in the way we live, work, and relate to one another. It is a new chapter in human development, enabled by technology advances that are commensurate with those of the first, second, and third industrial revolutions. The speed, breadth, and depth of this revolution are forcing us to rethink how countries should develop, how organizations create value, and even what it means to be human.
All these deep changes are possible also thanks to the recent developments in the field of metrology. Actually, the monitoring and the control of remote physical phenomena require the development of new sensors, acquisition techniques, data analysis, new architecture of data acquisition systems, and so on.

The 7^th edition of IEEE MetroInd4.0&IoT aims to discuss the contributions both of the metrology for the development of Industry 4.0 and IoT and the new opportunities offered by Industry 4.0 and IoT for the development of new measurement methods and instruments.

IEEE MetroInd4.0&IoT wants to federate stakeholders active in developing instrumentation and measurement methods for Industry 4.0 and IoT, with new technologies for metrology-assisted production, component measurement, sensors and associated signal conditioning, and calibration methods for electronic test.