TC-04 - High Frequency Measurement and Connector


Yeou Song Brian Lee

National Instruments
United States

The goals of this Committee are to:

  • Develop, promote and support standards for specifying arid characterizing the performance of High-Frequency devices and instrumentation and for specifying their associated measurement methods and recommended practices, to include such areas as power measurement, RF & Microwave, Spectrum Analysis Phase Noise, and Modulation Domains;
  • Promote effective and creative practices of high-frequency measurements and analysis via workshops, technical papers, and other dissemination media;
  • Maintain liaison with other groups, societies, and organizations working in the same area.