Skip to main content

IEEE.org  |  IEEE Xplore Digital Library  |  IEEE Standards  |  IEEE Spectrum  |  More Sites

IEEE.org
Home
  • Home
  • About
    • About IMS
      • About the I&M Society
      • Contact Us
      • Join IMS
    • Who We Are
      • Officers
      • Members-at-Large
      • Other AdCom Members
    • Chapters
      • Chapter Listing
    • Committees & Representatives
      • IMS Standing Committees
      • Representatives & Liaisons
    • History
      • Presidents
      • Members-at-Large
    • Governing Documents
      • Constitution
      • Bylaws
      • Society Handbook
      • Society Strategic Plan
  • Awards
    • Awards & Recognition Program
      • About Awards & Recognitions
    • Membership Awards
      • Outstanding Chapter Award
      • Outstanding Student Chapter Award
    • Technical & Standards Awards
      • Outstanding Technical Committee Award
    • Society Awards
      • Overview
      • Career Excellence Award
      • Distinguished Service Award
      • Outstanding Young Engineer Award
      • Technical Award
      • J. Barry Oakes Advancement Award
      • Best Application in I&M Award
    • Education Awards
      • Overview
      • Graduate Fellowship Award
      • Faculty Course Development Award
      • Best Dissertation Award
      • Undergraduate Student Scholarship
    • IEEE
      • IEEE Fellows
      • Tips for IEEE Fellow Nominations
      • IEEE Senior Members
      • Joseph F. Keithley Award in I&M
  • Activities
    • Technical Activities
      • About Technical & Standards Activities
      • Member Communities
      • Technical Committees Listing
      • Technical & Standards Activity Award
      • Standards Activities
    • Educational Activities
      • About Educational Activities
      • Education Awards
      • Distinguished Lecturer Program
      • Virtual Distinguished Lecturer Webinars
      • Video Tutorials Program
      • Short Courses
    • Membership Activities
      • About Membership Activities
      • Membership Benefits (Join Us)
      • Women in I&M
      • Student Activities
      • Young Professionals
      • Chapter Activities
      • Mentorship Program
  • Publications
    • General Information
      • About Publications
      • Featured Paper
      • Publications Committee
      • Andy Chi Best Paper Award
      • I&M Society Bookshelf
    • Society Publications
      • Instrumentation & Measurement Magazine
      • Transactions on Instrumentation and Measurement
      • Open Journal of Instrumentation and Measurement
      • I&M Society Newsletter
  • Conferences
    • General Information
      • About Conferences
      • Conferences Committee
      • Organize a Conference
    • Society Conferences
      • All Upcoming Events
      • Sponsored Conferences
      • Technically Co-sponsored Conferences
    • Other Events
TC-32 - Fault Tolerant Measurement Systems

Free Tools and Software

Online Mathematical Toolbox for Analytical Standard Uncertainty Evaluation

Mellin Transform-based Moment Calculator for Multivariate Polynomials

Improved Maximum Entropy Distribution Fitting

Benchmark Test Distributions

 

Technical Committee Home
  • News
  • Projects
  • Free Tools and Software
  • TC-32 Members

Home  |  Sitemap/More Sites  |  Contact & Support  |  Accessibility  |  Nondiscrimination Policy  |  IEEE Privacy Policy

© Copyright 2024 IEEE – All rights reserved. Use of this website signifies your agreement to the IEEE Terms and Conditions.
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.

This site is created, maintained, and managed by Conference Catalysts, LLC.
Please feel free to contact us for any assistance.