TC-10 Subcommittee: D/A Converters | IEEE Instrumentation & Measurement Society

The IEEE Std 1658-2011, “Standard for Terminologyand Test Methods for Digital-to-Analog Converters”, defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is restricted to monolithic, hybrid, and modular DACs and does not cover systems that incorporate DACs.

The Std. 1658 has been developed and is currently maintained by the D/A Converters Subcommitee.

D/A Converters Subcommittee Standards Association (SA) Site

TC-10 D/A Converters SC Chair

Luca De Vito

Università degli Studi del Sannio

Italy

Luca De Vito

Biography

Luca De Vito (M’10–SM’12) received the master’s (cum laude) degree in software engineering and the Ph.D. degree in information engineering from the University of Sannio, Benevento, Italy, in 2001 and 2005, respectively. His master’s thesis was on automatic classification and characterization of digitally modulated signals. He joined the Laboratory of Signal Processing and Measurement Information, University of Sannio, where he was involved in research activities. In 2008, he joined the Department of Engineering, University of Sannio, as an Assistant Professor in electric and electronic measurement. In 2013, he received the National Academic Qualification as an Associate Professor. Since 2015, he collaborates with the European Organization for Nuclear Research (CERN), Geneva, Switzerland, first as visiting scientist, and then as cooperation associate, working on magnet characterization, with the Magnetic Measurement Section (TE-MSC-MM), on diagnostics of cryogenic processes, with the Controls and Electrical Support Section (TE-CRG-CE), and on the characterization of RF cavities with the Hadron Synchrotrons Coherent effects Section (BE-ABP-HSC). Since June 2016 he is associated to the National Institute of Nuclear Physics (INFN) and collaborates to the ELI-NP (Extreme Light Infrastructure - Nuclear Physics) project.

He is Associate Editor of the ELSEVIER Measurement journal.

He is member of the IEEE since 2010, he is member of the IEEE Instrumentation and Measurement Society (IMS), of the IEEE Aerospace and Electronic System Society, and of the IEEE Standards Association. He is Senior Member of the IEEE since 2012. He is Chapter Chair Liaison of the IEEE IMS.

He is member of the AFCEA and is Young President of the AFCEA Naples Charter.

He published more than 100 papers on international journals and conference proceedings, mainly dealing with measurements for the telecommunications, data converter testing and biomedical instrumentation.

Affiliation(s)

Università degli Studi del Sannio

Italy