Go to: TC-10 Standards Participating in the TC-10 Standards Committee Document Repository (members only) Standard development organizations with similar interests to TC-10 National metrology institutes that provide calibration services applicable to TC10-developed-and-maintained standards Related Standards Applicable Books Applicable Technical Manuscripts TC-Standards Association (SA) Site TC-10 iMeet Page TC-10 STANDARDS The TC10 scope covers the science, technology, and application of electronic instrumentation and electrical measurement. TC10 is actively revising two of its standards: IEEE P181TM – IEEE Standard for Transitions, Pulses, and Related Waveforms (REVISION) IEEE P1696TM – IEEE Standard for Terminology and Test Methods for Circuit Probes (REVISION) For your reference, the IEEE Instrumentation and Measurement Society TC10 Waveform Generation and Measurement Standards Committee has developed, published, and maintains the standards listed below: IEEE 181-2011TM – IEEE Standard for Transitions, Pulses, and Related Waveforms IEEE 1057-2017TM – IEEE Standard for Digitizing Waveform Recorders IEEE 1241-2023TM – IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters IEEE 1658-2023TM – IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices IEEE 1696-2013TM – IEEE Standard for Terminology and Test Methods for Circuit Probes IEEE 2414-2020TM – IEEE Standard for Jitter and Phase Noise [Top] PARTICIPATING IN THE TC-10 STANDARDS COMMITTEE The benefit of joining the IEEE TC10 is that your membership provides you an opportunity to influence, guide, develop, and contribute to international standards that affect your industry, your research, and your procurement decisions. Read more here. If you are interested in participating in the Standards Committee, please send an email to: [email protected]. [Top] SIMILAR STANDARDS DEVELOPMENT ORGANIZATIONS The following are standards development organizations with similar interests to TC-10. International Electrotechnical Commission(IEC): Technical Committee (TC) 85, Measuring equipment for electrical and electromagnetic quantities TC47, Semiconductor devices [Top] CONTRIBUTING NATIONAL METROLOGY INSTITUTES The following are national metrology institutes that have contributed to and continue to contribute to the development of TC10 documentary standards and also provide calibration services applicable to TC10-developed-and-maintained standards. Korea Research Institute of Standards and Science (KRISS) National Institute of Metrology (NIM) National Institute of Standards and Technology (NIST) National Physical Laboratory (NPL) Physikalisch-Technische Bundesanstalt (PTB) [Top] RElATED STANDARDS International Electrotechnical Commission (IEC) IEC 60469:2013, Transitions, pulses and related waveforms: Terms, definitions and algorithms IEC 60748-4-3:2006, Semiconductor devices – Integrated circuits - Part 4-3: Interface integrated circuits – Dynamic criteria for analogue-digital converters (ADC) IEC 61280-2-3:2009, Fiber optic communication subsystem test procedures - Part 2-3: Digital systems - Jitter and wander measurements Institute of Electrical and Electronics Engineers (IEEE) IEEE Std 1007-1991, Jitter for Methods and Equipment for Measuring the Transmission Characteristics of Pulse-Code Modulation (PCM) Telecommunications Circuits and Systems IEEE Std 1394-2008, Jitter for High-Performance Serial Bus IEEE Std 1521-2003(R2010), Jitter in the Standard for Measurement of Video Jitter and Wander IEEE Std 1596.3-1996, Jitter for Low-Voltage Differential Signals (LVDS) for Scalable Coherent Interface (SCI) IEEE Std 686-1997, Jitter for Radar Definitions IEEE Std 743-1995, Jitter in the IEEE Standard Equipment Requirements and Measurement Techniques for Analog Transmission Parameters for Telecommunications IEEE Std 802.3-2008, Jitter in IEEE Standard for Information technology — Telecommunications and information exchange between systems — Local and metropolitan area networks — Specific requirements. Part 3: Carrier sense multiple access with Collision Detection (CSMA/CD) Access Method and Physical Layer Specifications International Telecommunications Union (ITU) ITU-R Recommendation BT.1363 (1998), Jitter Specifications and Methods for Jitter Measurements of Bit-Serial Signals Conforming to Recommendations ITU-R BT.656, ITU-R BT.799 and ITU-R BT.1120 ITU-T G.810 (1996), SERIES G: Transmission Systems and Media Digital Transmission Systems, Digital networks - Design objectives for digital networks - Definitions and terminology for synchronization networks [Top] APPLICABLE BOOKS The Data Conversion Handbook, 2005, Analog Devices Inc. ABC's of Probes, Primer, Tektronix Inc. [Top] APPLICABLE TECHNICAL MANUSCRIPTS JUMP TO: Waveform measurement, generation, and analysis | Waveform recorder test and evaluation | Analog-to-digital conversion | Digital-to-analog conversion | Circuit probes Waveform measurement, generation, and analysis I. Orfanos1, I. Makos, I. Liontos, E. Skantzakis, B. Förg, D. Charalambidis, and P. Tzallas, “Attosecond pulse metrology,” APL Photonics 4, 080901 (2019). https://doi.org/10.1063/1.5086773 Paulter NG Jr (2019) NIST Technical Note 2036, Comparison of the Measurement Uncertainties and Errors for the Waveform State Levels Estimated Using the Histogram Mode and Shorth Methods. https://doi.org/10.6028/NIST.TN.2036 Bieler M and Paulter NG (2016) Estimation of waveform state levels and uncertainties using the histogram and shorth methods, Conference on Precision Electromagnetic Measurements, CPEM 2016, pp. 10-15. https://doi.org/10.1109/CPEM.2016.7540806 N. G. Paulter and D. R. Larson, "Pulse metrology – Part 2," in IEEE Instrumentation & Measurement Magazine, vol. 15, no. 3, pp. 43-47, June 2012, https://doi.org/10.1109/MIM.2012.6204873 N. G. Paulter and D. R. Larson, "Pulse metrology: Part 1," in IEEE Instrumentation & Measurement Magazine, vol. 14, no. 3, pp. 39-44, June 2011, https://doi.org/10.1109/MIM.2011.5773536 D.R. Larson and N.G. Paulter, “Nanosecond delay with subpicosecond uncertainty,” Review of Scientific Instruments, Vol. 78, pp. 084701-1 to 084701-5, Sept. 2007 https://doi.org/10.1063/1.2760982 J. J. Blair, "Determining Frequency and Impulse Response Using Asymmetrical Pulses," in IEEE Transactions on Instrumentation and Measurement, vol. 56, no. 3, pp. 807-813, June 2007, https://doi.org/10.1109/TIM.2007.894182 D.R. Larson and N.G. Paulter, “A measurement of propagation delay,” Metrologia, Volume 44, pp. 64 to 68, 2007 http://dx.doi.org/10.1088/0026-1394/44/1/009 D.R. Larson and N.G. Paulter, “Some effects of temperature variation on sampling oscilloscopes and pulse generators,” Metrologia, Vol. 43, pp. 121 to 128, 2006, http://dx.doi.org/10.1088/0026-1394/43/1/017 N.G. Paulter and D.R. Larson, “The effect of tilt on waveform state levels and pulse parameters,” IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18 to 20 May 2004, pp. 1296 to 1300. https://doi.org/10.1109/IMTC.2004.1351303 D.R. Larson, N.G. Paulter, D.I. Bergman, “Pulse parameter dependence on transition position and epoch duration,” IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18 - 20 May 2004, pp. 1291 to 1295. https://doi.org/10.1109/IMTC.2004.1351302 N.G. Paulter and D.R. Larson, “Pulse parameter uncertainty analysis,” Metrologia, Vol. 39, 2002, pp. 143 to 155 https://doi.org/10.1088/0026-1394/39/2/4 O. M. Solomon, D. R. Larson and N. G. Paulter, "Comparison of some algorithms to estimate the low and high state level of pulses," IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188), Budapest, 2001, pp. 96-101 vol.1, https://doi.org/10.1109/IMTC.2001.928794 N.G. Paulter, "Low-jitter trigger system for pulse calibration and intercomparison of high-speed samplers," IEEE Transactions on Instrumentation and Measurement, Vol. 47, pp. 606 to 608, June, 1998. https://doi.org/10.1109/19.744308 N.G. Paulter, "The effect of histogram size on histogram-derived pulse parameters," IEEE Transactions on Instrumentation and Measurement, Vol. 47, pp. 609 to 612, June, 1998. https://doi.org/10.1109/19.744309 J. J. Blair, "Error estimates for frequency responses calculated from time-domain measurements," in IEEE Transactions on Instrumentation and Measurement, vol. 47, no. 2, pp. 345-353, April 1998, https://doi.org/10.1109/19.744173 J. P. Deyst, T. M. Souders and J. J. Blair, "Uncertainties of frequency response estimates derived from responses to uncertain step-like inputs," Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec, Brussels, Belgium, 1996, pp. 151-155 vol.1, https://doi.org/10.1109/IMTC.1996.507366 Waveform recorder test and evaluation J. J. Blair, "Method for eliminating aliasing in the measurement of the step response for a waveform recorder," Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510), Como, 2004, pp. 310-313 Vol.1, https://doi.org/10.1109/IMTC.2004.1351051 J. Blair, "Sine-fitting software for IEEE Standards 1057 and 1241," IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309), Venice, 1999, pp. 1504-1506 vol.3, https://doi.org/10.1109/IMTC.1999.776077 J. J. Blair, "A method for characterizing waveform recorder errors using the power spectral distribution," in IEEE Transactions on Instrumentation and Measurement, vol. 41, no. 5, pp. 604-610, Oct. 1992, https://doi.org/10.1109/19.177329 J. J. Blair, "A method for characterizing waveform recorder errors using the power spectral distribution," in IEEE Transactions on Instrumentation and Measurement, vol. 41, no. 5, pp. 604-610, Oct. 1992, https://doi.org/10.1109/19.177329 T. M. Souders, D. R. Flach and J. J. Blair, "Step and frequency response testing of waveform recorders," 7th IEEE Conference on Instrumentation and Measurement Technology, San Jose, CA, USA, 1990, pp. 214-220, https://doi.org/10.1109/IMTC.1990.66001 Analog-to-digital conversion “Analog-Digital Converters: What do you need to know to understand this topic?,” http://www.onmyphd.com/?p=analog.digital.converter M. Gudino, “Engineering Resources: Basics of Analog-to-Digital Converters,” 17 Apr 2018, https://www.arrow.com/en/research-and-events/articles/engineering-resource-basics-of-analog-to-digital-converters P. Sagsveen, “ADC/DAC Tutorial,” Digi-Key Electronics, 2017-09-13, https://www.digikey.com/en/articles/adc-dac-tutorial. B. Herd, “Analog to digital converter (ADC): A true understanding,” 5 May 2016, https://hackaday.com/2016/05/05/analog-to-digital-conversion/ J. J. Blair, "Selecting Test Frequencies for Two-Tone Phase-Plane Analysis of ADCs: Part II," in IEEE Transactions on Instrumentation and Measurement, vol. 56, no. 4, pp. 1171-1175, Aug. 2007, doi: 10.1109/TIM.2007.899910. https://doi.org/10.1109/TIM.2007.899910 T.E. Linnenbrink; J. Blair; S. Rapuano; P. Daponte; E. Balestrieri; L. De Vito; S. Max; S.J. Tilden, "ADC testing - Part 7 in a series of tutorials in Instrumentation and Measurements," in IEEE Instrumentation & Measurement Magazine, vol. 9, no. 2, pp. 37-47, Arpil 2006, https://doi.org/10.1109/MIM.2006.1634987 D. A. Rauth and V. T. Randal, "Analog-to-digital conversion. part 5," IEEE Instrumentation & Measurement Magazine, vol. 8, no. 4, pp. 44-54, Oct. 2005, https://doi.org/10.1109/MIM.2005.1518622. S. Rapuano; P. Daponte; E. Balestrieri; L. De Vito; S.J. Tilden; S. Max; J. Blair, "ADC parameters and characteristics," in IEEE Instrumentation & Measurement Magazine, vol. 8, no. 5, pp. 44-54, Dec. 2005, https://doi.org/10.1109/MIM.2005.1578617 I. Kollar and J. J. Blair, "Improved determination of the best fitting sine wave in ADC testing," in IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 5, pp. 1978-1983, Oct. 2005, https://doi.org/10.1109/TIM.2005.855082 K. Fowler, "Part 7: analog-to-digital conversion in real-time systems," in IEEE Instrumentation & Measurement Magazine, vol. 6, no. 3, pp. 58-64, Sept. 2003, https://doi.org/10.1109/MIM.2003.1238355. J. J. Blair, "Selecting test frequencies for two-tone phase plane analysis of ADCs," in IEEE Transactions on Instrumentation and Measurement, vol. 51, no. 5, pp. 976-979, Oct. 2002, https://doi.org/10.1109/TIM.2002.807805 J. Blair, "Selecting test frequencies for two-tone phase plane analysis of ADC's," IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188), Budapest, 2001, pp. 1843-1846 vol.3, https://doi.org/10.1109/IMTC.2001.929518 J. Blair, "Histogram measurement of ADC nonlinearities using sine waves," in IEEE Transactions on Instrumentation and Measurement, vol. 43, no. 3, pp. 373-383, June 1994, https://doi.org/10.1109/19.293454 Digital-to-analog conversion “Introduction to Digital-Analog Conversion, Chapter 13 - Digital-Analog Conversion,” https://www.allaboutcircuits.com/textbook/digital/chpt-13/digital-analog-conversion/ P. Sagsveen, “ADC/DAC Tutorial,” Digi-Key Electronics, 2017-09-13, https://www.digikey.com/en/articles/adc-dac-tutorial Circuit probes “Passive Probe Ground Lead Effects,” Teledyne Lecory, 2013, https://cdn.teledynelecroy.com/files/appnotes/passive_probe_ground_lead_effects.pdf “Eight Hints for Better Scope Probing, Application Note,” Keysight Technologies, https://prc.keysight.com/Content/PDF_Files/5989-7894EN.pdf “Choosing the Best Passive and Active Oscilloscope Probes for Your Tasks, Application Note,” Keysight Technologies, https://prc.keysight.com/Content/PDF_Files/5990-8576EN.PDF “The Truth About the Fidelity of High-Bandwidth Voltage Probes, Application Note,” Keysight Technologies, https://prc.keysight.com/Content/PDF_Files/5988-6515EN.pdf H. Johnson “Probing High-Speed Digital Designs,” first printed in Electronic Design, March, 1997, http://www.sigcon.com/Pubs/straight/probes.htm A. Frost, D. Whiteman, and J. Tsai, “Are you measuring your circuit or your scope probe?,” EDN Magazine, 22 July 1999, pp. 53 to 58, https://www.edn.com/wp-content/uploads/1999/07/7.22.19_DF.pdf N. Davis, “An Introduction to Oscilloscope Probes,” All About Circuits, June 29, 2017, https://www.allaboutcircuits.com/technical-articles/an-introduction-to-oscilloscope-probes/ “Oscilloscope probes - an overview or tutorial about the various types of oscilloscope probe that are available for use with oscilloscopes,” Electronics Notes, https://www.electronics-notes.com/articles/test-methods/oscilloscope/scope-probes.php “Oscilloscope Probe Specifications & Parameters,” Electronics Notes, https://www.electronics-notes.com/articles/test-methods/oscilloscope/scope-probe-specifications.php D. Maliniak, “Oscilloscope Probes Influence Measurements,” Electronic Design, 6 May 2014, https://www.electronicdesign.com/technologies/test-measurement/article/21799660/oscilloscope-probes-influence-measurements [Top]
The TC10 scope covers the science, technology, and application of electronic instrumentation and electrical measurement. TC10 is actively revising two of its standards: IEEE P181TM – IEEE Standard for Transitions, Pulses, and Related Waveforms (REVISION) IEEE P1696TM – IEEE Standard for Terminology and Test Methods for Circuit Probes (REVISION) For your reference, the IEEE Instrumentation and Measurement Society TC10 Waveform Generation and Measurement Standards Committee has developed, published, and maintains the standards listed below: IEEE 181-2011TM – IEEE Standard for Transitions, Pulses, and Related Waveforms IEEE 1057-2017TM – IEEE Standard for Digitizing Waveform Recorders IEEE 1241-2023TM – IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters IEEE 1658-2023TM – IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices IEEE 1696-2013TM – IEEE Standard for Terminology and Test Methods for Circuit Probes IEEE 2414-2020TM – IEEE Standard for Jitter and Phase Noise [Top]
