TC-10 Subcommittee: Jitter | IEEE Instrumentation & Measurement Society

The IEEE 2414-2020 "Standard for Jitter and Phase Noise", defines specifications, modeling methods, and terminology for the dispersion of specified instants of repetitive and/or periodic signals in electronics, telecommunications, and measurement, which is referred to as jitter and phase noise.

The Std. 2414 has been developed and is currently maintained by the Jitter Subcommittee.

Jitter Subcommittee Standards Association (SA) Site

TC-10 Jitter SC Chair

Sergio Rapuano

University of Sannio

Italy

Sergio Rapuano

Biography

Sergio Rapuano achieved the MS degree in Electronic Engineering with honors in 1999 and the PhD degree in Computer Science, Applied Electromagnetism and Telecommunications in 2003 from University of Salerno, Italy.

In 2002 he joined the Faculty of Engineering of the University of Sannio, where he currently is Associate Professor of Electric and Electronic Measurement at the Department of Engineering.

He is senior member of the IEEE Instrumentation and Measurement Society and member of the IEEE Standards Association. In particular, within the Instrumentation and Measurement Society he is: Chapter Chair liaison, member of the “Waveform Generation, Measurement and Analysis” Technical Committee (TC-10), chairing the Subcommittee on “Jitter Measurement”; member of the Technical Committee on “Education for Instrumentation and Measurement” (TC-23); vice-chairman of the Subcommittee on Objective Blood Pressure Measurement formed within the Technical Committee on “Medical and Biological Measurements” (TC-25), secretary of the TC-25.

Since 2003 he participated in the organisation of several international scientific meetings in the field of Electronic Measurements: the IEEE International Instrumentation and Measurement Technical Conferences, the International Measurement Confederation (IMEKO) TC-4 Symposia, the IEEE International Workshops on Medical Measurements and Applications, the IMEKO International Workshops on Analog to Digital Converters Modelling and Testing, playing different roles: session chairman, member of the technical program committee, technical co-chairman, general co-chairman.

He published more than 150 papers in international journals and in national and international conference proceedings on the following subjects: ADC and DAC Modelling and Testing, Digital Signal Processing, Distributed Measurement Systems, Medical Measurement and has been guest editor of the following journals: IEEE Transactions on Instrumentation and Measurement, Measurement, Computer Standards and Interfaces and International Journal of Advanced Media and Communications.

He received from the IEEE Instrumentation and Measurement Society the Outstanding Young Engineer Award 2007.

Affiliation(s)

University of Sannio

Italy