Jitter presentation in Orvieto, 2011 2014 TC Annual Report 2017 TC Annual Report 2019 TC Annual Report 2021 TC Annual Report About TC-10 T.E. Linnenbrink, W.B. Boyer, N.G. Paulter, and S.J. Tilden, “IEEE TC-10: What’s It All About,” IEEE Instrumentation and Measurement Technology Conference, Vail, CO, USA, 20 to 22 May 2003, pp. 106 to 109.https://doi.org/10.1109/IMTC.2003.1208130 T.E. Linnenbrink, W.B. Boyer, N.G. Paulter, and S.J. Tilden, “IEEE TC-10: Update 2006,” IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24 to 27 April 2006.https://doi.org/10.1109/IMTC.2006.328299 T.E. Linnenbrink, W.B. Boyer, Robert M. Graham, N.G. Paulter, S.J. Tilden, "IEEE TC-10: Update 2008," 16th IMEKO TC-4 Symposium, Florence, Italy, 22 to 24 September 2008, pp. 476 - 480.http://citeseerx.ist.psu.edu/viewdoc/citations;jsessionid=4FEAFEA5D612292243809A98DB091BB5?doi=10.1.1.497.2642 T.E. Linnenbrink, S.J. Tilden, W.B. Boyer, N.G. Paulter, and T. Ellis, “IEEE TC-10: Update 2011,” Proceedings of the Joint IMEKO International Workshop on ADC Modeling and IEEE 2011 ADC Form, Orvieto, IT, 30 June to 1 July 2011.https://www.semanticscholar.org/paper/IEEE-TC-10%3A-Update-2011-%7C-NIST-Paulter-Linnenbrink/74e0b662a6c45c8a5d893a769987ccb3ab89914e S. Rapuano, L De Vito, J. Jendzurski, W.B. Boyer, S.J. Tilden, and N.G. Paulter, Jr., “The IEEE TC-10 Standards: Update 2019,” 23rd IMEKO TC4 International Symposium on Electrical & Electronic Measurements, Promote Industry 4.0, September 17-20, 2019, Xi’an, China.https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927697 About Specific TC-10-developed Standards N. G. Paulter, D. R. Larson and J. J. Blair, "The IEEE standard on transitions, pulses, and related waveforms, Std-181-2003," in IEEE Transactions on Instrumentation and Measurement, vol. 53, no. 4, pp. 1209-1217, Aug. 2004.https://doi.org/10.1109/TIM.2004.831470 N. G. Paulter, J. R. Jendzurski, M. McTigue, B. Hagerup and T. Linnenbrink, "The forthcoming IEEE standard 1696 on test methods for characterizing circuit probes," 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Minneapolis, MN, 2013, pp. 1412-1415.https://doi.org/10.1109/i2mtc.2013.6555646 W.B. Boyer, T.E. Linnenbrink, J.J. Blair, “New Features of IEEE Std 1057-2007 Digitizing Waveform Recorders,” 2011 International Workshop on ADC Modelling, Testing and Data Converter Analysis and Design and IEEE 2011 ADC Forum, June 30 to July 1, 2011. Orvieto, Italy.https://www.imeko.org/publications/iwadc-2011/IMEKO-IWADC-2011-40.pdf
