2024 TC Annual Report 2023 TC Annual Report 2022 TC Annual Report 2021 TC Annual Report 2020 TC Annual Report 2019 TC Annual Report 2017 TC Annual Report 2014 TC Annual Report Jitter presentation in Orvieto, Italy 2011 About TC-1 L. De Vito, J. Jendzurski, S. Rapuano, W.B. Boyer, J. Blair and N.G. Paulter, "The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021," IEEE Instrumentation & Measurement Magazine, vol. 25, no. 8, pp. 16-18, November 2022. https://doi.org/10.1109/MIM.2022.9908270. L. De Vito, J. Jendzursk, S. Rapuano, W. B. Boyer, J. Blair and N. G. Paulter, "The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee," in IEEE Instrumentation & Measurement Magazine, vol. 24, no. 8, pp. 7-10, November 2021, https://doi.org/10.1109/MIM.2021.9580778. S. Rapuano, J. Jendzurski, L. De Vito, S. Tilden, W. Boyer, N.G. Paulter, “The documentary standards of the IEEE technical committee 10,” IEEE Instrumentation & Measurement Magazine, vol. 23, no. 8, pp. 8-14, November 2020. http://dx.doi.org/10.1109/MIM.2020.9257054. S. Rapuano, L De Vito, J. Jendzurski, W.B. Boyer, S.J. Tilden, and N.G. Paulter, Jr., “The IEEE TC-10 Standards: Update 2019,” 23rd IMEKO TC4 International Symposium on Electrical & Electronic Measurements, Promote Industry 4.0, September 17-20, 2019, Xi’an, China. https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927697 T.E. Linnenbrink, S.J. Tilden, W.B. Boyer, N.G. Paulter, and T. Ellis, “IEEE TC-10: Update 2011,” Proceedings of the Joint IMEKO International Workshop on ADC Modeling and IEEE 2011 ADC Form, Orvieto, IT, 30 June to 1 July 2011. https://www.semanticscholar.org/paper/IEEE-TC-10%3A-Update-2011-%7C-NIST-Paulter-Linnenbrink/74e0b662a6c45c8a5d893a769987ccb3ab89914e T.E. Linnenbrink, W.B. Boyer, Robert M. Graham, N.G. Paulter, S.J. Tilden, "IEEE TC-10: Update 2008," 16th IMEKO TC-4 Symposium, Florence, Italy, 22 to 24 September 2008, pp. 476 - 480. http://citeseerx.ist.psu.edu/viewdoc/citations;jsessionid=4FEAFEA5D612292243809A98DB091BB5?doi=10.1.1.497.2642 T.E. Linnenbrink, W.B. Boyer, N.G. Paulter, and S.J. Tilden, “IEEE TC-10: Update 2006,” IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24 to 27 April 2006. https://doi.org/10.1109/IMTC.2006.328299 T.E. Linnenbrink, W.B. Boyer, N.G. Paulter, and S.J. Tilden, “IEEE TC-10: What’s It All About,” IEEE Instrumentation and Measurement Technology Conference, Vail, CO, USA, 20 to 22 May 2003, pp. 106 to 109. https://doi.org/10.1109/IMTC.2003.1208130 About Specific TC-10-developed Standards N. G. Paulter, J. R. Jendzurski, M. McTigue, B. Hagerup and T. Linnenbrink, "The forthcoming IEEE standard 1696 on test methods for characterizing circuit probes," 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Minneapolis, MN, 2013, pp. 1412-1415. https://doi.org/10.1109/i2mtc.2013.6555646 W.B. Boyer, T.E. Linnenbrink, J.J. Blair, “New Features of IEEE Std 1057-2007 Digitizing Waveform Recorders,” 2011 International Workshop on ADC Modelling, Testing and Data Converter Analysis and Design and IEEE 2011 ADC Forum, June 30 to July 1, 2011. Orvieto, Italy. https://www.imeko.org/publications/iwadc-2011/IMEKO-IWADC-2011-40.pdf N. G. Paulter, D. R. Larson and J. J. Blair, "The IEEE standard on transitions, pulses, and related waveforms, Std-181-2003," in IEEE Transactions on Instrumentation and Measurement, vol. 53, no. 4, pp. 1209-1217, Aug. 2004. https://doi.org/10.1109/TIM.2004.831470 Superseded IEEE Standards Click Here to View
