TIM Editor-in-Chief

Ruqiang Yan

[email protected]

Xi'an Jiaotong University

China

Senior Area Editor: Medical, Biomedical, and Healthcare Instrumentation and Measurement

Kurt Barbé

[email protected]

Vrije Universiteit Brussel, Brussels

Belgium

Senior Area Editor: Circuits and Electronics

Jesús Ureña

[email protected]

University of Alcalá

Spain

Senior Area Editor: Power Instrumentation and Measurement

Roberto Ferrero

[email protected]

University of Liverpool

United Kingdom

Senior Area Editor: Automation, Fault Diagnosis, Maintenance, and Testing

Lorenzo Ciani

[email protected]

University of Florence

Italy

Dario Petri

[email protected]

University of Trento

Italy

Senior Area Editor: Artificial Intelligence for Instrumentation and Measurement

Daniele Fontanelli

[email protected]

University of Trento

Italy

TIM Associate Editor-in-Chief

Mohamed Abou-Khousa

[email protected]

Khalifa University of Science & Technology

United Arab Emirates

Fabricio Guimaraes Baptista

[email protected]

Universidade Estadual Paulista Júlio

Brazil

Bruno Albuquerque de Castro

[email protected]

São Paulo State University

Brazil

Huang-Chen Lee

[email protected]

National Chung-Cheng University

Taiwan

Datong Liu

[email protected]

Harbin Institute of Technology

China

Adam G. Polak

[email protected]

Wroclaw University of Science & Technology

Poland

Seyed Hossein Hesamedin Sadeghi

[email protected]

Amirkabir University of Technology

Iran

Hongrui Wang

[email protected]

Delft University of Technology

Netherlands

Emanuele Zappa

[email protected]

Politecnico di Milano

Italy

TIM Associate Editor

Marco Agustoni

[email protected]

Federal Institute of Metrology METAS

Switzerland

Fernando J. Álvarez

[email protected]

University of Extremadura

Spain

Yasutaka Amagai

[email protected]

National Metrology Institute of Japan

Japan

Bruno Andò

[email protected]

University of Catania

Italy

Rosenda Valdes Arencibia

[email protected]

Federal University of Uberlândia

Brazil

David Ayllon

[email protected]

UBTECH Robotics

United States

Christoph Baer

[email protected]

Ruhr-Universität Bochum

Germany

Libing Bai

[email protected]

University of Electronic Science and Technology of China

China

Yang Bai

[email protected]

National Institute of Metrology (NIM)

China

Sasan Bakhtiari

[email protected]

Argonne National Laboratory

United States

Grazia Barchi

[email protected]

Eurac Research

Italy

Shovan Barma

[email protected]

Indian Institute of Information Technology, Guwahati

India

Gui-Bin Bian

[email protected]

Institute of Automation, Chinese Academy of Sciences

China

Valentina Bianchi

[email protected]

University of Parma

Italy

Alice Buffi

[email protected]

University of Pisa

Italy

Eduardo Cabal-Yepez

[email protected]

University of Guanajuato

Mexico

Gaigai Cai

[email protected]

Xidian University

China

Nuria Novas Castellano

[email protected]

University of Almería

Spain

Yau Chung Chan

[email protected]

City University of Hong Kong

Hong Kong SAR China

Hongtian Chen

[email protected]

Shanghai Jiao Tong University

China

Xun Chen

[email protected]

University of Science and Technology of China

China

Zhenghua Chen

[email protected]

Institute for Infocomm Research (I2R), Agency for Science, Technology and Research (A*STAR)

Singapore

Yuhua Cheng

[email protected]

University of Electronic Science & Technology of China

China

Valentina Cosentino

[email protected]

University of Palermo

Italy

Loredana Cristaldi

[email protected]

Politecnico di Milano

Italy

Anoop C. S.

[email protected]

Indian Institute of Space Science and Technology

India

Ziqiang Cui

[email protected]

Tianjin University

China

Alessio De Angelis

[email protected]

University of Perugia

Italy

Branislav Djokic

[email protected]

National Research Council

Canada

Guanfeng Du

[email protected]

Northeast Electric Power University

China

Pranab Kumar Dutta

[email protected]

Indian Institute of Technology, Kharagpur

India

Matthew Dvorsky

[email protected]

Center for Nondestructive Evaluation

United States

Damodar Reddy Edla

[email protected]

National Institute of Technology, Goa

India

Güvenir Kaan Esen

[email protected]

Turkish Standards Institute

Turkey

Isaac Fan

[email protected]

National Institute of Standards and Technology

United States

Wei Fan

[email protected]

School of Mechanical Engineering, Jiangsu University

China

Ke Feng

[email protected]

University of British Columbia

Mohamad Forouzanfar

[email protected]

SRI International

United States

Ada Fort

[email protected]

University of Siena

Italy

Guglielmo Frigo

[email protected]

Swiss Federal Institute of Metrology

Switzerland

Michael E. Gadringer

[email protected]

Austria

Alessandra Galli

[email protected]

University of Padova

Italy

Yuan Gao

[email protected]

Apple. Inc.

United States

Javad R. Gatabi

[email protected]

SeekOps Inc.

United States

Jose A. Gázquez Parra

[email protected]

University of Almería

Spain

Boby George

[email protected]

Indian Institute of Technology, Madras

India

Sabrina Grassini

[email protected]

Politecnico di Torino

Italy

Salvatore Graziani

[email protected]

Università di Catania

Italy

Tuan Guo

[email protected]

Jinan University

China

Rajarshi Gupta

[email protected]

University of Calcutta

Kamel Haddadi

[email protected]

University of Lille 1

France

Hamed Hamzehbahmani

[email protected]

Durham University

United Kingdom

Jae-Ho Han

[email protected]

Korea University

South Korea

Álvaro Hernández

[email protected]

University of Alcala

Spain

José A. Hidalgo-López

[email protected]

Moinul Hossain

[email protected]

University of Kent

United Kingdom

M. Shamim Hossain

[email protected]

King Saud University

Saudi Arabia

Jingyu Hua

[email protected]

Zhejiang Gongshang University

China

Yulong Huang

[email protected]

Harbin Engineering University

China

Weiguo Huang

[email protected]

Soochow University

China

Chi Hung Hwang

[email protected]

Taiwan Instrument Research Institute, NARLabs

Taiwan

Tarikul Islam

[email protected]

Jamia Millia Islamia (University)

India

Yandan Jiang

[email protected]

Zhejiang University

China

Carlos G. Juan

[email protected]

Technical University of Cartagena / Miguel Hernández University of Elche

Spain

Donghoon Kang

[email protected]

Korea Institute of Science and Technology

South Korea

Tae-Weon Kang

[email protected]

Korea Research Institute of Standards & Science

South Korea

Yuto Kato

[email protected]

National Institute of Advanced Industrial Science and Technology

Japan

Martti Kirkko-Jaakkola

[email protected]

Nordic Inertial, Akaa

Finland

Yuya Koyama

[email protected]

Chiba Institute of Technology

Japan

Sougata Kumar Kar

[email protected]

National Institute of Technology, Rourkela

India

V. Jagadeesh Kumar

[email protected]

Indian Institute of Technology, Madras

India

Anant Kumar Verma

[email protected]

Universidad de O'Higgins

Chile

Paweł Kwiatkowski

[email protected]

Military University of Technology

Poland

Jochen Lang

[email protected]

University of Ottawa

Canada

Massimo Lazzaroni

[email protected]

Università degli Studi di Milano

Italy

Jing Lei

[email protected]

North China Electric Power University

China

Shisong Li

[email protected]

Bureau International des Poids et Mesures

France

Weihua Li

[email protected]

Huazhong University of Science and Technology

China

Chengyu Liu

[email protected]

Southeast University

China

Huan Liu

[email protected]

China University of Geosciences

China

Wenqiang Liu

[email protected]

Hong Kong Polytechnic University

China

Zhigang Liu

[email protected]

Southwest Jiaotong University

China

Siliang Lu

[email protected]

Anhui University

China

Yixin Ma

[email protected]

Shanghai Jiao Tong University

China

Mirko Marracci

[email protected]

University of Pisa

Italy

Qiang Miao

[email protected]

Sichuan University

China

George Mois

[email protected]

Technical University of Cluj-Napoca

Romania

Priya Ranjan Muduli

[email protected]

Indian Institute of Technology, Varanasi

India

Arunava Naha

[email protected]

Uppsala University

Sweden

Gabriele Patrizi

[email protected]

University of Florence

Italy

Pritam Paral

[email protected]

Department of Electrical Engineering, Indian Institute of Engineering Science and Technology (IIEST)

India

Marco Pau

[email protected]

Fraunhofer Institute for Energy Economics and Energy System Technology

Germany

Francesco de Paulis

[email protected]

Electromagnetic Compatibility and Signal Integrity Laboratory, University of L'Aquila

Italy

Paolo Attilio Pegoraro

[email protected]

University of Cagliari

Italy

Lihui Peng

[email protected]

Tsinghua University

China

Zhengyu Peng

[email protected]

Aptiv

Ireland

Ferdinanda Ponci

[email protected]

RWTH Aachen University

Germany

Octavian Adrian Postolache

[email protected]

Instituto Universitário de Lisboa

Portugal

Xiangchen Qian

[email protected]

North China Electric Power University

China

Sergio Rapuano

[email protected]

University of Sannio.

Italy

Zhen Ren

[email protected]

University of Chicago

United States

Mahdi Saleh

[email protected]

Department of Electrical and Electronic Engineering

United Kingdom

Ali Asghar Nazari Shirehjini

[email protected]

University of Ottawa

Canada

Daniel Slomovitz

[email protected]

Universidad de la República

Uruguay

Shiraz Sohail

[email protected]

National Institute of Technology, Tiruchirappalli

India

Yang Song

[email protected]

Southwest Jiaotong University

China

Roman Sotner

[email protected]

Brno University of Technology

Czechia

Susanna Spinsante

[email protected]

Marche Polytechnic University

Italy

Sara Sulis

[email protected]

University of Cagliari

Italy

Chuang Sun

[email protected]

Xi’an Jiaotong University

China

Jiangtao Sun

[email protected]

Beihang University

China

Linas Svilainis

[email protected]

Kaunas University of Technology

Lithuania

Chao Tan

[email protected]

Tianjin University

China

Xiaotong Tu

[email protected]

Xiamen University

China

Helko E. van den Brom

[email protected]

VSL Dutch Metrology Insitute

Netherlands

Benkuan Wang

[email protected]

Harbin Institute of Technology

China

Chao Wang

[email protected]

Tianjin University

China

Dong Wang

[email protected]

Shanghai Jiao Tong University

China

Qing Wang

[email protected]

Durham University

United Kingdom

Shibin Wang

[email protected]

Xi'an Jiaotong University

China

Wilson Wang

[email protected]

Lakehead University

Canada

Takuma Watanabe

[email protected]

University of Toyama

Japan

He Wen

[email protected]

Hunan University

China

Min Xia

[email protected]

Western University

Canada

Maria Gabriella Xibilia

[email protected]

University of Messina

Italy

Lin Xu

[email protected]

ShanghaiTech University

China

Xianqiang Yang

[email protected]

Harbin Institute of Technology

China

Yu Yang

[email protected]

Xiamen University

China

Yunjie Yang

[email protected]

University of Edinburgh

United Kingdom

Bardia Yousefi

[email protected]

University of Maryland (UMD)

United States

Jianbo Yu

[email protected]

Tongji University

China

Jing Yuan

[email protected]

University of Shanghai for Science and Technology

China

Jing Yuan

[email protected]

Nankai University

China

Xiaofeng Yuan

[email protected]

Central South University

China

Dan Zhang

Zhejiang University of Technology

China

Lei Zhang

[email protected]

Chongqing University

China

Liuyang Zhang

[email protected]

Xi'an Jiaotong University

Ming Zhang

[email protected]

Aston University

United Kingdom

Shiwu Zhang

[email protected]

University of Science and Technology of China

China

Yan Zhuang

[email protected]

Dalian University of Technology

China

Zhenbing Zhao

[email protected]

North China Electric Power University

China

Zhibin Zhao

[email protected]

Xi'an Jiaotong University

China

Kunpeng Zhu

[email protected]

Institute of Intelligent Machines, Chinese Academy of Sciences

China

Assistant Transactions Administrators

Laura Roach

[email protected]

Editorial Assistant

United States

Shannon Warkus

[email protected]

Editorial Assistant

United States